Microstrip transmission line model‐fitting approach for characterization of textile materials as dielectrics and conductors for wearable electronics
Characterization of contact resistance of low-value resistor by transmission line model (TLM) method
2002 ◽
Vol 85
(3)
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pp. 16-22
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2001 ◽
Vol 48
(4)
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pp. 758-766
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Keyword(s):
2012 ◽
Vol 54
(5)
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pp. 1077-1086
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Keyword(s):