An evaluation of surface roughness after staining of different composite resins using atomic force microscopy and a profilometer

2020 ◽  
Author(s):  
Ozcan Karatas ◽  
Pınar Gul ◽  
Mustafa Gündoğdu ◽  
Demet T. Iskenderoglu
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Composite Resins ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Composite resin for restoration of a posterior tooth and polishing: clinical case report

2019 ◽  
Vol 8 (4) ◽  
Author(s):  
Frederico dos Reis Goyatá ◽  
Sávio Morato de Lacerda Gontijo ◽  
José Alcides Almeida de Arruda ◽  
João Batista Novaes Júnior ◽  
Ivan Doche Barreiros ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Composite Resin ◽  
Composite Resins ◽  
Resin Composites ◽  
Posterior Teeth ◽  
Force Microscopy ◽  
Atomic Force ◽  
Amalgam Restoration ◽  
Before And After

The aim of the present report was to describe a case of direct composite resin restoration in tooth 46, with emphasis on the importance of polishing. A 21-year-old female patient dissatisfied with the aesthetic amalgam restoration of her tooth 46 came to the our institution for correction of the situation. The procedure performed consisted of registration of occlusal contacts, selection of resin color, removal of amalgam restoration, coronal reconstruction with composite resin, occlusal adjustment, finishing and polishing, with the use of atomic force microscopy of the resin before and after polishing. A correct clinical protocol for the posterior composite resins is fundamental for the optimization of aesthetic results, for clinical performance and for consequent restorative longevity. The atomic force microscopy images of the resin used before and after polishing emphasize the necessity and clinical importance of this operative step.Descriptors: Dental Materials; Dental Restoration, Permanent; Dental Polishing; Microscopy.ReferencesFrese C, Staehle HJ, Wolff D. The assessment of dentofacial esthetics in restorative dentistry: a review of the literature. J Am Dent Assoc. 2012;143(5):461-66.Moraschini V, Fai CK, Alto RM, dos Santos GO. Amalgam and resin composite longevity of posterior restorations: A systematic review and meta-analysis. J Dent. 2015;43(9):1043-50.Kovarik RE. Restoration of posterior teeth in clinical practice: evidence base for choosing amalgam versus composite. Dent Clin North Am. 2009;53(1):71-6.Kanzow P, Wiegand A, Schwendicke F. Cost-effectiveness of repairing versus replacing composite or amalgam restorations. J Dent. 2016;54:41-7.Lynch CD, Opdam NJ, Hickel R, Brunton PA, Gurgan S, Kakaboura A, et al. Guidance on posterior resin composites: Academy of Operative Dentistry - European Section. J Dent. 2014;42(4):377-83.Fernández E, Martín J, Vildósola P, Oliveira Junior OB, Gordan V, Mjor I et al. Can repair increase the longevity of composite resins? Results of a 10-year clinical trial. J Dent. 2015;43(2):279-86.Sabbagh J, McConnell RJ, McConnell MC. Posterior composites: Update on cavities and filling techniques. J Dent. 2017;57:86-90.Constantinescu DM, Apostol DA, Picu CR, Krawczyk K, Sieberer M. Mechanical properties of epoxy nanocomposites reinforced with functionalized silica nanoparticles. Proc Struct Integ. 2017;5:647-52.Yadav RD, Raisingani D, Jindal D, Mathur R. A comparative analysis of different finishing and polishing devices on nanofilled, microfilled, and hybrid composite: a scanning electron microscopy and profilometric study. Int J Clin Pediatr Dent. 2016;9(3):201-8.Fernandes ACBCJ, Assunção IV, Borges BCD, Costa GFA. Impact of additional polishing on the roughness and surface morphology of dental composite resins. Rev Port Estomatol Med Dent Cirur Maxilofac. 2016;57(2):74-81.Antonson SA, Yazici AR, Kilinc E, Antonson DE, Hardigan PC. Comparison of different finishing/polishing systems on surface roughness and gloss of resin composites. J Dent. 2011;39(Suppl 1):e9-17.Kumari CM, Bhat KM, Bansal R. Evaluation of surface roughness of different restorative composites after polishing using atomic force microscopy. J Conserv Dent. 2016;19(1):56-62.Pimentel PEZ, Goyatá FR, Cunha LG. Influência da técnica de polimento na lisura superficial de resinas compostas. Clin int j braz dent. 2012;8(2):226-34.Chour RG, Moda A, Arora A, Arafath MY, Shetty VK, Rishal Y. Comparative evaluation of effect of different polishing systems on surface roughness of composite resin: An in vitro study. J Int Soc Prev Community Dent. 2016;6(Suppl 2):166-70.Lins FC, Ferreira RC, Silveira RR, Pereira CN, Moreira AN, Magalhaes CS. Surface roughness, microhardness, and microleakage of a silorane-based composite resin after immediate or delayed finishing/polishing. Int J Dent. 2016;2016:8346782.

Brittle Behaviour in Aspirin Crystals: Evidence of Spalling Fracture

2020 ◽  
Author(s):  
Benjamin P. A. Gabriele ◽  
Craig J. Williams ◽  
Douglas Stauffer ◽  
Brian Derby ◽  
Aurora J. Cruz-Cabeza
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Single Crystals ◽  
Spalling Fracture ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Imaging

<div> <div> <div> <p>Single crystals of aspirin form I were cleaved and indented on their dominant face. Upon inspection, it was possible to observe strongly anisotropic shallow lateral cracks due to the extreme low surface roughness after cleavage. Atomic Force Microscopy (AFM) imaging showed spalling fractures nucleating from the indent corners, forming terraces with a height of one or two interplanar spacings d100. The formation of such spalling fractures in aspirin was rationalised using basic calculations of attachment energies, showing how (100) layers are poorly bonded when compared to their relatively higher intralayer bonding. An attempt at explaining the preferential propagation of these fractures along the [010] direction is discussed. </p> </div> </div> </div>

Brittle Behaviour in Aspirin Crystals: Evidence of Spalling Fracture

2020 ◽  
Author(s):  
Benjamin P. A. Gabriele ◽  
Craig J. Williams ◽  
Douglas Stauffer ◽  
Brian Derby ◽  
Aurora J. Cruz-Cabeza
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Single Crystals ◽  
Spalling Fracture ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Imaging

<div> <div> <div> <p>Single crystals of aspirin form I were cleaved and indented on their dominant face. Upon inspection, it was possible to observe strongly anisotropic shallow lateral cracks due to the extreme low surface roughness after cleavage. Atomic Force Microscopy (AFM) imaging showed spalling fractures nucleating from the indent corners, forming terraces with a height of one or two interplanar spacings d100. The formation of such spalling fractures in aspirin was rationalised using basic calculations of attachment energies, showing how (100) layers are poorly bonded when compared to their relatively higher intralayer bonding. An attempt at explaining the preferential propagation of these fractures along the [010] direction is discussed. </p> </div> </div> </div>

scholarly journals Atomic force microscopy comparative analysis of the surface roughness of two posterior chamber phakic intraocular lens models: ICL versus IPCL

2021 ◽  
Vol 21 (1) ◽  
Author(s):  
Juan Gros-Otero ◽  
Samira Ketabi ◽  
Rafael Cañones-Zafra ◽  
Montserrat Garcia-Gonzalez ◽  
Cesar Villa-Collar ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Intraocular Lenses ◽  
Posterior Chamber ◽  
Anterior Surface ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Phakic Intraocular Lenses ◽  
Roughness Measurements

Abstract Background To compare the anterior surface roughness of two commercially available posterior chamber phakic intraocular lenses (IOLs) using atomic force microscopy (AFM). Methods Four phakic IOLs were used for this prospective, experimental study: two Visian ICL EVO+ V5 lenses and two iPCL 2.0 lenses. All of them were brand new, were not previously implanted in humans, were monofocal and had a dioptric power of − 12 diopters (D). The anterior surface roughness was assessed using a JPK NanoWizard II® atomic force microscope in contact mode immersed in liquid. Olympus OMCL-RC800PSA commercial silicon nitride cantilever tips were used. Anterior surface roughness measurements were made in 7 areas of 10 × 10 μm at 512 × 512 point resolution. The roughness was measured using the root-mean-square (RMS) value within the given regions. Results The mean of all anterior surface roughness measurements was 6.09 ± 1.33 nm (nm) in the Visian ICL EVO+ V5 and 3.49 ± 0.41 nm in the iPCL 2.0 (p = 0.001). Conclusion In the current study, we found a statistically significant smoother anterior surface in the iPCL 2.0 phakic intraocular lenses compared with the VISIAN ICL EVO+ V5 lenses when studied with atomic force microscopy.

Copper Diffusion Into Aluminum-Silicon Metallizations by Accelerated Thermal and Electrical Stressing

1996 ◽  
Vol 428 ◽  
Author(s):  
G. O. Ramseyer ◽  
L. H. Walsh ◽  
J. V. Beasock ◽  
H. F. Helbig ◽  
R. C. Lacoe ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Depth Profiling ◽  
Copper Diffusion ◽  
Force Microscopy ◽  
Atomic Force ◽  
Line Widths ◽  
Electromigration Lifetime

AbstractPatterned 930 nm Al(1%-Si) interconnects over 147 nm of Cu were electromigration lifetime tested at 1.0–1.5 × 105 A/cm2 at 250 °C. The morphology of the surfaces of the electromigrated stripes with different line widths and times to failure were characterized by atomic force microscopy, and changes in surface roughness were compared. The diffusion of copper into the electromigrated aluminum stripes was determined by depth profiling using Auger electron spectroscopy. In particular, areas where hillocks formed were examined and compared to areas of median roughness.

Scaling Analysis of a- and poly-Si Surface Roughness by Atomic Force Microscopy

1994 ◽  
Vol 367 ◽  
Author(s):  
T. Yoshinobu ◽  
A. Iwamoto ◽  
K. Sudoh ◽  
H. Iwasaki
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Surface Area ◽  
Scaling Behavior ◽  
Linear Size ◽  
Scaling Analysis ◽  
Macroscopic Scale ◽  
Force Microscopy ◽  
Atomic Force ◽  
Roughness Exponent

AbstractThe scaling behavior of the surface roughness of a-and poly-Si deposited on Si was investigated by atomic force microscopy (AFM). The interface width W(L), defined as the rms roughness as a function of the linear size of the surface area, was calculated from various sizes of AFM images. W(L) increased as a power of L with the roughness exponent ∝ on shorter length scales, and saturated at a constant value of on a macroscopic scale. The value of roughness exponent a was 0.48 and 0.90 for a-and poly-Si, respectively, and σ was 1.5 and 13.6nm for 350nm-thick a-Si and 500nm-thick poly-Si, respectively. The AFM images were compared with the surfaces generated by simulation.

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