easySLM-STED: Stimulated emission depletion microscopy with aberration correction, extended field of view and multiple beam scanning
2018 ◽
Vol 11
(11)
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pp. e201800087
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Keyword(s):
2008 ◽
Vol 190
(1)
◽
pp. 27-31
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Keyword(s):
1999 ◽
Vol 18
(2)
◽
pp. 147-152
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