Intermittent-contact Scanning Electrochemical Microscopy (IC-SECM) as a Quantitative Probe of Defects in Single Crystal Boron Doped Diamond Electrodes
2004 ◽
Vol 108
(39)
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pp. 15117-15127
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2009 ◽
Vol 18
(5-8)
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pp. 816-819
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Keyword(s):
2002 ◽
Vol 149
(6)
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pp. E179
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2010 ◽
Vol 40
(10)
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pp. 1829-1838
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2006 ◽
Vol 53
(4)
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pp. 839-844
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Keyword(s):