Fault diagnosis of analog circuits by X-Y zoning method and operation-region model

2006 ◽  
Vol 89 (8) ◽  
pp. 42-50
Author(s):  
Yukiya Miura
Keyword(s):  
Fault Diagnosis ◽  
Analog Circuits ◽  
Region Model

Analog Circuits Fault Diagnosis Using Multifractal Analysis

2013 ◽  
Vol 721 ◽  
pp. 367-371
Author(s):  
Yong Kui Sun ◽  
Zhi Bin Yu
Keyword(s):  
Support Vector Machine ◽  
Fault Diagnosis ◽  
Analog Circuits ◽  
Multifractal Analysis ◽  
Multifractal Spectrum ◽  
Experimental Results ◽  
Support Vector ◽  
Diagnosis Accuracy ◽  
Circuit Under Test

Analog circuits fault diagnosis using multifractal analysis is presented in this paper. The faulty response of circuit under test is analyzed by multifratal formalism, and the fault feature consists of multifractal spectrum parameters. Support vector machine is used to identify the faults. Experimental results prove the proposed method is effective and the diagnosis accuracy reaches 98%.

Data-fused method of fault diagnosis for analog circuits

2008 ◽  
Vol 61 (1) ◽  
pp. 87-92 ◽  
Author(s):  
Yanghong Tan ◽  
Yigang He ◽  
Yichuang Sun ◽  
Hui Yang ◽  
Meirong Liu
Keyword(s):  
Fault Diagnosis ◽  
Analog Circuits

scholarly journals Fault Diagnosis for Analog Circuits by Using EEMD, Relative Entropy, and ELM

2016 ◽  
Vol 2016 ◽  
pp. 1-9 ◽  
Author(s):  
Jian Xiong ◽  
Shulin Tian ◽  
Chenglin Yang
Keyword(s):  
Fault Diagnosis ◽  
Relative Entropy ◽  
Analog Circuits ◽  
Ensemble Empirical Mode Decomposition ◽  
Intrinsic Mode Functions ◽  
Mode Decomposition ◽  
Diagnosis Method ◽  
Eemd Method ◽  
Learning Machine ◽  
Elm Classifier

This paper presents a novel fault diagnosis method for analog circuits using ensemble empirical mode decomposition (EEMD), relative entropy, and extreme learning machine (ELM). First, nominal and faulty response waveforms of a circuit are measured, respectively, and then are decomposed into intrinsic mode functions (IMFs) with the EEMD method. Second, through comparing the nominal IMFs with the faulty IMFs, kurtosis and relative entropy are calculated for each IMF. Next, a feature vector is obtained for each faulty circuit. Finally, an ELM classifier is trained with these feature vectors for fault diagnosis. Via validating with two benchmark circuits, results show that the proposed method is applicable for analog fault diagnosis with acceptable levels of accuracy and time cost.

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