Application of X-ray methods for the investigation of structural effects caused by high-energy argon ions bombardment in silicon crystal

1987 ◽  
Vol 22 (4) ◽  
pp. K59-K62 ◽  
Author(s):  
J. Auleytner ◽  
Z. Furmanik ◽  
J. Gorecka
Keyword(s):  
Silicon Crystal ◽  
High Energy ◽  
Structural Effects ◽  
X Ray ◽  
Argon Ions ◽  
Ray Methods

scholarly journals Synchrotron high energy X-ray methods coupled to phase sensitive analysis to characterize aging of solid catalysts with enhanced sensitivity

2013 ◽  
Vol 15 (22) ◽  
pp. 8629 ◽  
Author(s):  
Davide Ferri ◽  
Mark A. Newton ◽  
Marco Di Michiel ◽  
Songhak Yoon ◽  
Gian Luca Chiarello ◽  
...  
Keyword(s):  
High Energy ◽  
Sensitive Analysis ◽  
X Ray ◽  
Solid Catalysts ◽  
Enhanced Sensitivity ◽  
Phase Sensitive ◽  
Ray Methods

Radial oxygen precipitation of a 12” CZ silicon crystal studied in-situ with high energy X-ray diffraction

2014 ◽  
Vol 211 (11) ◽  
pp. 2450-2454 ◽  
Author(s):  
Christoph Bergmann ◽  
Johannes Will ◽  
Alexander Gröschel ◽  
Matthias Weisser ◽  
Andreas Magerl
Keyword(s):  
Silicon Crystal ◽  
High Energy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Oxygen Precipitation

Formation of Substructure and Texture in Dual-Phase Steels due to Thermal Treatment

2010 ◽  
Vol 160 ◽  
pp. 147-152
Author(s):  
M. Masimov ◽  
Helmut Klein
Keyword(s):  
Synchrotron Radiation ◽  
Thermal Treatment ◽  
High Energy ◽  
Dual Phase ◽  
Texture Formation ◽  
X Ray ◽  
Dp Steels ◽  
Initial Texture ◽  
Bcc Phase ◽  
Ray Methods

Microstructure and texture formation in DP steels obtained by thermal treatment at temperatures of 780 °C i.e. between Ac1 and Ac3 and at 900 °C, i.e. above Ac3 and following different cooling techniques were studied by means of X-ray and electron diffraction techniques. The formation of the different structure constituents as well as substructure parameters such as blocks size and misorientation between them induced by thermal treatment was detailed analyzed. Various methods – conventional X-ray methods, high-energy synchrotron radiation and EBSD measuring – the texture of the bcc phase were applied in order to investigate their influence on the results. Beside texture heredity, a softening of the initial texture components induced by cold rolling and of related anisotropy of steels due to thermal treatment was estimated.

Bent-crystal monochromators for high-energy synchrotron radiation

1998 ◽  
Vol 5 (3) ◽  
pp. 699-701 ◽  
Author(s):  
Hitoshi Yamaoka ◽  
Tetsuro Mochizuki ◽  
Yoshiharu Sakurai ◽  
Hiroshi Kawata
Keyword(s):  
Finite Element ◽  
Synchrotron Radiation ◽  
Compton Scattering ◽  
Silicon Crystal ◽  
High Energy ◽  
Finite Element Analyses ◽  
X Ray ◽  
Bent Crystal ◽  
Dominant Process ◽  
Bent Crystals

Two kinds of monochromators covering the energy ranges 100–150 keV and ∼300 keV have been designed for inelastic (Compton) scattering experiments at the elliptical multipole wiggler beamline, BL08W, of SPring-8. Finite-element analyses using ANSYS for bent crystals indicate that thermal problems are not serious for the 300 keV monochromator, while an energy spread of about 10−3 for the 100–150 keV monochromator is possible in the centre of the crystal. Detailed calculations of X-ray interaction with the silicon crystal were performed. The results show that Compton scattering is a dominant process and deposits about 100 W continuously.

scholarly journals An interplay between electronic and structural effects on the photoluminescence decay mechanisms in LaPO4·nH2O:Tb3+ and LaPO4:Tb3+ single-crystal nanorods

2018 ◽  
Vol 6 (46) ◽  
pp. 12643-12651 ◽  
Author(s):  
M. T. Colomer ◽  
S. Díaz-Moreno ◽  
A. Tamayo ◽  
A. L. Ortiz ◽  
J. Chaboy
Keyword(s):  
Single Crystal ◽  
Absorption Spectroscopy ◽  
Energy Resolution ◽  
High Energy ◽  
High Energy Resolution ◽  
Structural Effects ◽  
X Ray ◽  
Photoluminescence Decay ◽  
X Ray Absorption

A novel High Energy Resolution Fluorescence Detected X-ray Absorption Spectroscopy (HERFD-XAS) study at the Tb L3-edge for the rhabdophane-type LaPO4·nH2O:Tb3+ and the monazite-type LaTbPO4:Tb3+ nanorods is reported.

The Microstructure of Steatite (Protoenstatite)

1985 ◽  
Vol 43 ◽  
pp. 236-237
Author(s):  
W. E. Lee ◽  
A. H. Heuer
Keyword(s):  
High Frequency ◽  
Glass Ceramics ◽  
Magnesium Silicate ◽  
Beam Current ◽  
Glassy Matrix ◽  
Angle Of Incidence ◽  
X Ray ◽  
Mechanical And Electrical Properties ◽  
Argon Ions ◽  
High Temperature Polymorph

IntroductionTraditional steatite ceramics, made by firing (vitrifying) hydrous magnesium silicate, have long been used as insulators for high frequency applications due to their excellent mechanical and electrical properties. Early x-ray and optical analysis of steatites showed that they were composed largely of protoenstatite (MgSiO3) in a glassy matrix. Recent studies of enstatite-containing glass ceramics have revived interest in the polymorphism of enstatite. Three polymorphs exist, two with orthorhombic and one with monoclinic symmetry (ortho, proto and clino enstatite, respectively). Steatite ceramics are of particular interest a they contain the normally unstable high-temperature polymorph, protoenstatite.Experimental3mm diameter discs cut from steatite rods (∼10” long and 0.5” dia.) were ground, polished, dimpled, and ion-thinned to electron transparency using 6KV Argon ions at a beam current of 1 x 10-3 A and a 12° angle of incidence. The discs were coated with carbon prior to TEM examination to minimize charging effects.

High-purity Ge x-ray detectors: Sensitivity factors and usefulness

1990 ◽  
Vol 48 (2) ◽  
pp. 548-548
Author(s):  
E. B. Steel
Keyword(s):  
High Purity ◽  
High Energy ◽  
Quantitative Chemical Analysis ◽  
Detector Performance ◽  
X Ray ◽  
Detector Sensitivity ◽  
Specimen Holder ◽  
Many Instruments ◽  
Charge Resolution ◽  
Sensitivity Factors

High Purity Germanium (HPGe) x-ray detectors are now commercially available for the analytical electron microscope (AEM). The detectors have superior efficiency at high x-ray energies and superior resolution compared to traditional lithium-drifted silicon [Si(Li)] detectors. However, just as for the Si(Li), the use of the HPGe detectors requires the determination of sensitivity factors for the quantitative chemical analysis of specimens in the AEM. Detector performance, including incomplete charge, resolution, and durability has been compared to a first generation detector. Sensitivity factors for many elements with atomic numbers 10 through 92 have been determined at 100, 200, and 300 keV. This data is compared to Si(Li) detector sensitivity factors.The overall sensitivity and utility of high energy K-lines are reviewed and discussed. Many instruments have one or more high energy K-line backgrounds that will affect specific analytes. One detector-instrument-specimen holder combination had a consistent Pb K-line background while another had a W K-line background.

Designing high-resolution slow scan CCD-based TEM camera systems

1992 ◽  
Vol 50 (2) ◽  
pp. 946-947
Author(s):  
James F. Mancuso ◽  
William B. Maxwell ◽  
Russell E. Camp ◽  
Mark H. Ellisman
Keyword(s):  
Fiber Optics ◽  
Ccd Camera ◽  
High Energy ◽  
Phosphor Layer ◽  
X Ray ◽  
Light Production ◽  
Camera Systems ◽  
X Ray Imaging ◽  
Electron Image ◽  
Scintillating Fiber

The imaging requirements for 1000 line CCD camera systems include resolution, sensitivity, and field of view. In electronic camera systems these characteristics are determined primarily by the performance of the electro-optic interface. This component converts the electron image into a light image which is ultimately received by a camera sensor.Light production in the interface occurs when high energy electrons strike a phosphor or scintillator. Resolution is limited by electron scattering and absorption. For a constant resolution, more energy deposition occurs in denser phosphors (Figure 1). In this respect, high density x-ray phosphors such as Gd2O2S are better than ZnS based cathode ray tube phosphors. Scintillating fiber optics can be used instead of a discrete phosphor layer. The resolution of scintillating fiber optics that are used in x-ray imaging exceed 20 1p/mm and can be made very large. An example of a digital TEM image using a scintillating fiber optic plate is shown in Figure 2.

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