Antimony and Antimony?Tin Doped Indium Oxide, IAO and IATO: Promising Transparent Conductors.

ChemInform ◽  
2005 ◽  
Vol 36 (2) ◽  
Author(s):  
J. Choisnet ◽  
L. Bizo ◽  
R. Retoux ◽  
B. Raveau
2004 ◽  
Vol 6 (10) ◽  
pp. 1121-1123 ◽  
Author(s):  
J. Choisnet ◽  
L. Bizo ◽  
R. Retoux ◽  
B. Raveau

2016 ◽  
Vol 28 (22) ◽  
pp. 224003 ◽  
Author(s):  
A T Vai ◽  
N Rashidi ◽  
Y Fang ◽  
V L Kuznetsov ◽  
P P Edwards

2006 ◽  
Vol 89 (2) ◽  
pp. 616-619 ◽  
Author(s):  
Oliver Warschkow ◽  
Lj. Miljacic ◽  
D. E. Ellis ◽  
G. B. Gonzalez ◽  
T. O. Mason

2020 ◽  
Vol 7 (1) ◽  
pp. 236-243 ◽  
Author(s):  
Jack E. N. Swallow ◽  
Benjamin A. D. Williamson ◽  
Sanjayan Sathasivam ◽  
Max Birkett ◽  
Thomas J. Featherstone ◽  
...  

Superior transparent conducting properties of indium oxide realised by molybdenum donors resonant in the conduction band, avoiding detrimental effects of tin doping.


1995 ◽  
Vol 403 ◽  
Author(s):  
K. Von Rottkay ◽  
M. Rubin ◽  
N. Ozer

AbstractThin films of tin-doped indium oxide are widely used for transparent conductors. One application of ln203:Sn (ITO) is transparent contacts for electrochromic electrodes. Optical design of electrochromic devices requires knowledge of the optical constants for each layer from the near ultraviolet and visible to the mid infrared. Determination of the optical constants of the electrochromic layer cannot be made in isolation; a complete device or at least a half-cell including a layer of ITO is required to change the optical state of the electrochromic material. Measurements on ITO were made using variable-angle spectral ellipsometry, and spectral transmittance and reflectance. A series of structural models were fit to this data. The problem is complicated because of inhomogeneity in the films, variability in the manufacturing process, and sensitivity to environmental conditions. The spectral dependency was modeled by a single Lorentz oscillator and a Drude free-electron component. This data was then used as the basis for a model to extract the optical constants for a tungsten oxide electrochromic film.


Author(s):  
I. A. Rauf

To understand the electronic conduction mechanism in Sn-doped indium oxide thin films, it is important to study the effect of dopant atoms on the neighbouring indium oxide lattice. Ideally Sn is a substitutional dopant at random indium sites. The difference in valence (Sn4+ replaces In3+) requires that an extra electron is donated to the lattice and thus contributes to the free carrier density. But since Sn is an adjacent member of the same row in the periodic table, the difference in the ionic radius (In3+: 0.218 nm; Sn4+: 0.205 nm) will introduce a strain in the indium oxide lattice. Free carrier electron waves will no longer see a perfect periodic lattice and will be scattered, resulting in the reduction of free carrier mobility, which will lower the electrical conductivity (an undesirable effect in most applications).One of the main objectives of the present investigation is to understand the effects of the strain (produced by difference in the ionic radius) on the microstructure of the indium oxide lattice when the doping level is increased to give high carrier densities. Sn-doped indium oxide thin films were prepared with four different concentrations: 9, 10, 11 and 12 mol. % of SnO2 in the starting material. All the samples were prepared at an oxygen partial pressure of 0.067 Pa and a substrate temperature of 250°C using an Edwards 306 coating unit with an electron gun attachment for heating the crucible. These deposition conditions have been found to give optimum electrical properties in Sn-doped indium oxide films. A JEOL 2000EX transmission electron microscope was used to investigate the specimen microstructure.


2007 ◽  
Vol 2007 (suppl_26) ◽  
pp. 489-494 ◽  
Author(s):  
J. Popović ◽  
E. Tkalčec ◽  
B. Gržeta ◽  
C. Goebbert ◽  
V. Ksenofontov ◽  
...  

2021 ◽  
Vol 133 ◽  
pp. 111078 ◽  
Author(s):  
Xing Liu ◽  
Lu Zhang ◽  
Yudong Li ◽  
Xianzhu Xu ◽  
Yunchen Du ◽  
...  

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