ChemInform Abstract: Oxygen Reduction at La0.5Sr0.5MnO3 Thin Film/Yttria-Stabilized Zirconia Interface Sudied by Impedance Spectroscopy.

ChemInform ◽  
2010 ◽  
Vol 25 (48) ◽  
pp. no-no
Author(s):  
B. GHARBAGE ◽  
T. PAGNIER ◽  
A. HAMMOU
Keyword(s):  
Thin Film ◽  
Impedance Spectroscopy ◽  
Oxygen Reduction ◽  
Yttria Stabilized Zirconia ◽  
Stabilized Zirconia

Proton-Conducting Thin Film Grown on Yttria-Stabilized Zirconia Surface for Ammonia Gas Sensing Technologies

2009 ◽  
Vol 12 (9) ◽  
pp. J73 ◽  
Author(s):  
Shinya Teranishi ◽  
Kyohei Kondo ◽  
Masakazu Nishida ◽  
Wataru Kanematsu ◽  
Takashi Hibino
Keyword(s):  
Thin Film ◽  
Gas Sensing ◽  
Yttria Stabilized Zirconia ◽  
Stabilized Zirconia ◽  
Ammonia Gas ◽  
Proton Conducting

Magnetic properties of epitaxial TmFe2O4 thin films with an anomalous interfacial structure

2020 ◽  
Vol 8 (34) ◽  
pp. 11704-11714
Author(s):  
You Jin Kim ◽  
Shinya Konishi ◽  
Yuichiro Hayasaka ◽  
Ryo Ota ◽  
Ryosuke Tomozawa ◽  
...  
Keyword(s):  
Thin Film ◽  
Magnetic Properties ◽  
Exchange Bias ◽  
Interface Structure ◽  
Yttria Stabilized Zirconia ◽  
Interfacial Structure ◽  
Stabilized Zirconia ◽  
Bias Effect ◽  
Exchange Bias Effect ◽  
Glassy Behavior

Epitaxial TmFe2O4 thin film with self-assembled interface structure was grown on yttria-stabilized zirconia substrate. TmFe2O4 phase itself shows glassy behavior and the interface leads to the exchange bias effect.

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