Quantitative surface analysis of hemp fibers using XPS, conventional and low voltage in-lens SEM
2015 ◽
Vol 133
(8)
◽
pp. n/a-n/a
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2014 ◽
Vol 28
(14)
◽
pp. 1639-1639
◽
The angular dependence on photoemission and its significance to quantitative surface analysis by XPS
1981 ◽
Vol 3
(2)
◽
pp. 67-71
◽
1979 ◽
Vol 12
(2)
◽
pp. 89-90
◽
1981 ◽
Vol 7
(4)
◽
pp. 419-424
◽