Quantitative surface analysis of hemp fibers using XPS, conventional and low voltage in-lens SEM

2015 ◽  
Vol 133 (8) ◽  
pp. n/a-n/a ◽  
Author(s):  
Rowan W. Truss ◽  
Barry Wood ◽  
Ron Rasch
2011 ◽  
Vol 44 (2) ◽  
pp. 192-199 ◽  
Author(s):  
K. J. Kim ◽  
W. E. S. Unger ◽  
J. W. Kim ◽  
D. W. Moon ◽  
T. Gross ◽  
...  

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