High polarization levels in poly(vinylidene fluoride-trifluoroethylene) ferroelectric thin films doped with diethyl phthalate

2003 ◽  
Vol 88 (6) ◽  
pp. 1416-1419 ◽  
Author(s):  
Haisheng Xu ◽  
Suolong Ni ◽  
Changzheng Yang
2013 ◽  
Vol 12 (5) ◽  
pp. 433-438 ◽  
Author(s):  
Mengyuan Li ◽  
Harry J. Wondergem ◽  
Mark-Jan Spijkman ◽  
Kamal Asadi ◽  
Ilias Katsouras ◽  
...  

2010 ◽  
Vol 405 (1) ◽  
pp. 183-187
Author(s):  
P. F. Liu ◽  
X. J. Meng ◽  
J. L. Wang ◽  
J. H. Chu ◽  
P. Gemeiner ◽  
...  

2013 ◽  
Vol 103 (4) ◽  
pp. 042909 ◽  
Author(s):  
B. B. Tian ◽  
Z. H. Chen ◽  
A. Q. Jiang ◽  
X. L. Zhao ◽  
B. L. Liu ◽  
...  

2001 ◽  
Vol 665 ◽  
Author(s):  
Feng Xia ◽  
H.S. Xu ◽  
Babak Razavi ◽  
Q. M. Zhang

ABSTRACTFerroelectric polymer thin films are attractive for a wide range of applications such as MEMS, IR sensors, and memory devices. We present the results of a recent investigation on the thickness dependence of the ferroelectric properties of poly(vinylidene fluoridetrifluoroethylene) copolymer spin cast films on electroded Si substrate. We show that as the film thickness is reduced, there exist two thickness regions. For films at thickness above 100 nm, the thickness dependence of the ferroelectric properties can be attributed to the interface effect. However, for thinner films, there is a large change in the ferroelectric properties such as the polarization level, the coercive field, and polarization switching speed, which is related to the large drop of the crystallinity in the ultrathin film region (below 100 nm). The results from Xray, dielectric measurement, and AFM all indicate that there is a threshold thickness at about 100 nm below which the crystallinity in the film reduces abruptly.


2010 ◽  
Vol 519 (4) ◽  
pp. 1441-1444 ◽  
Author(s):  
Sharon Roslyn Oh ◽  
Kui Yao ◽  
Choi Lan Chow ◽  
Francis Eng Hock Tay

2020 ◽  
Vol 52 (12) ◽  
pp. 1150-1155
Author(s):  
Sabine Apelt ◽  
Susanne Höhne ◽  
Petra Uhlmann ◽  
Ute Bergmann

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