Direct Mapping of Phospholipid Ferroptotic Death Signals in Cells and Tissues by Gas Cluster Ion Beam Secondary Ion Mass Spec‐trometry (GCIB‐SIMS)

2021 ◽  
Author(s):  
Louis Sparvero ◽  
Hua Tian ◽  
Andrew A. Amoscato ◽  
Wan-Yang Sun ◽  
Tamil S. Anthonymuthu ◽  
...  
Keyword(s):  
Ion Beam ◽  
Direct Mapping ◽  
Mass Spec ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam ◽  
Secondary Ion ◽  
Death Signals ◽  
In Cells

Quantitative analysis of lipids with argon gas cluster ion beam secondary ion mass spectrometry

2014 ◽  
Vol 46 (12-13) ◽  
pp. 1129-1132
Author(s):  
Makiko Fujii ◽  
Shunichirou Nakagawa ◽  
Toshio Seki ◽  
Takaaki Aoki ◽  
Jiro Matsuo
Keyword(s):  
Mass Spectrometry ◽  
Quantitative Analysis ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
Argon Gas ◽  
Ion Mass Spectrometry ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam ◽  
Secondary Ion

Fast Neutral Ar Penetration during Gas Cluster Ion Beam Irradiation into Magnetic Thin Films

2003 ◽  
Vol 792 ◽  
Author(s):  
Shigeru Kakuta ◽  
Toshio Seki ◽  
Shinji Sasaki ◽  
Kenji Furusawa ◽  
Takaaki Aoki ◽  
...  
Keyword(s):  
Ion Beam ◽  
Magnetic Thin Films ◽  
Cube Root ◽  
Beam Irradiation ◽  
Ion Beam Irradiation ◽  
Ion Density ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam ◽  
Acceleration Voltage ◽  
Secondary Ion

ABSTRACTAr penetration during gas cluster ion beam (GCIB) irradiation has been investigated using secondary ion mass spectroscopy (SIMS). The concentration of Ar rose to a maximum and then decreased gradually with increasing depth. The depth of the Ar penetration peak increased in proportion to the cube root of the acceleration voltage of GCIB and was independent of ion dose. Ar penetration was attributed to fast neutrals in the GCIB and was successfully suppressed by decreasing the pressure of the space downstream of the GCIB or decreasing the monomer ion density in order to suppress charge transfer collisions.

Improvement of the gas cluster ion beam-(GCIB)-based molecular secondary ion mass spectroscopy (SIMS) depth profile with O2+ cosputtering

The Analyst ◽  
2016 ◽  
Vol 141 (8) ◽  
pp. 2523-2533 ◽  
Author(s):  
Yi-Hsuan Chu ◽  
Hua-Yang Liao ◽  
Kang-Yi Lin ◽  
Hsun-Yun Chang ◽  
Wei-Lun Kao ◽  
...  
Keyword(s):  
Steady State ◽  
Depth Profile ◽  
Mass Spectroscopy ◽  
Ion Beam ◽  
Depth Profiles ◽  
Tof Sims ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam ◽  
Secondary Ion ◽  
Sims Depth Profile

The Ar2500+ and O2+ cosputter in ToF-SIMS depth profiles retained >95% molecular ion intensity in the steady-state.

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