Tip-Enhanced Raman Spectroscopy to Distinguish Toxic Oligomers from Aβ1- 42 Fibrils at the Nanometer Scale

2017 ◽  
Vol 129 (7) ◽  
pp. 1797-1800 ◽  
Author(s):  
Sébastien Bonhommeau ◽  
David Talaga ◽  
Julien Hunel ◽  
Christophe Cullin ◽  
Sophie Lecomte
Keyword(s):  
Raman Spectroscopy ◽  
Nanometer Scale ◽  
Tip Enhanced Raman Spectroscopy

Label free investigation of biomolecules on the nanometer scale using tip-enhanced Raman spectroscopy

2010 ◽  
Author(s):  
Volker Deckert ◽  
Tanja Deckert-Gaudig ◽  
Marc Richter ◽  
Regina Treffer ◽  
Xiumei Lin
Keyword(s):  
Raman Spectroscopy ◽  
Nanometer Scale ◽  
Label Free ◽  
Tip Enhanced Raman Spectroscopy

Tip-Enhanced Raman Spectroscopy to Distinguish Toxic Oligomers from Aβ1- 42 Fibrils at the Nanometer Scale

2017 ◽  
Vol 56 (7) ◽  
pp. 1771-1774 ◽  
Author(s):  
Sébastien Bonhommeau ◽  
David Talaga ◽  
Julien Hunel ◽  
Christophe Cullin ◽  
Sophie Lecomte
Keyword(s):  
Raman Spectroscopy ◽  
Nanometer Scale ◽  
Tip Enhanced Raman Spectroscopy

scholarly journals Revealing the local crystallinity of single silicon core–shell nanowires using tip-enhanced Raman spectroscopy

2020 ◽  
Vol 11 ◽  
pp. 1147-1156 ◽  
Author(s):  
Marius van den Berg ◽  
Ardeshir Moeinian ◽  
Arne Kobald ◽  
Yu-Ting Chen ◽  
Anke Horneber ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Structural Properties ◽  
Silicon Nanowires ◽  
Optical Resolution ◽  
Chemical Vapor ◽  
Nanometer Scale ◽  
Core Shell ◽  
Polarization Angle ◽  
Amorphous Si ◽  
Tip Enhanced Raman Spectroscopy

Tip-enhanced Raman spectroscopy is combined with polarization angle-resolved spectroscopy to investigate the nanometer-scale structural properties of core–shell silicon nanowires (crystalline Si core and amorphous Si shell), which were synthesized by platinum-catalyzed vapor–liquid–solid growth and silicon overcoating by thermal chemical vapor deposition. Local changes in the fraction of crystallinity in these silicon nanowires are characterized at an optical resolution of about 300 nm. Furthermore, we are able to resolve the variations in the intensity ratios of the Raman peaks of crystalline Si and amorphous Si by applying tip-enhanced Raman spectroscopy, at sample positions being 8 nm apart. The local crystallinity revealed using confocal Raman spectroscopy and tip-enhanced Raman spectroscopy agrees well with the high-resolution transmission electron microscopy images. Additionally, the polarizations of Raman scattering and the photoluminescence signal from the tip–sample nanogap are explored by combining polarization angle-resolved emission spectroscopy with tip-enhanced optical spectroscopy. Our work demonstrates the significant potential of resolving local structural properties of Si nanomaterials at the sub-10 nanometer scale using tip-enhanced Raman techniques.

Surface-and tip-enhanced Raman spectroscopy of silicon

2008 ◽  
Author(s):  
K. J. Yi ◽  
X. N. He ◽  
W. Q. Yang ◽  
Y. S. Zhou ◽  
W. Xiong ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Tip Enhanced Raman Spectroscopy

Capability of tip-enhanced Raman spectroscopy about nanoscale analysis of strained silicon for semiconductor devices production

2017 ◽  
Vol 110 (10) ◽  
pp. 103105 ◽  
Author(s):  
Arianna Lucia ◽  
Onofrio Antonino Cacioppo ◽  
Enrico Iulianella ◽  
Luca Latessa ◽  
Giuseppe Moccia ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Semiconductor Devices ◽  
Strained Silicon ◽  
Tip Enhanced Raman Spectroscopy

Recent Advances in Tip-Enhanced Raman Spectroscopy

2014 ◽  
Vol 5 (18) ◽  
pp. 3125-3130 ◽  
Author(s):  
Matthew D. Sonntag ◽  
Eric A. Pozzi ◽  
Nan Jiang ◽  
Mark C. Hersam ◽  
Richard P. Van Duyne
Keyword(s):  
Raman Spectroscopy ◽  
Recent Advances ◽  
Tip Enhanced Raman Spectroscopy
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