Solution‐Processed High‐Performance ZnO Nano‐FETs Fabricated with Direct‐Write Electron‐Beam‐Lithography‐Based Top‐Down Route
Keyword(s):
Top Down
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Resist Design Considerations for Direct Write and Projection Electron-Beam Lithography Technologies.
1996 ◽
Vol 9
(4)
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pp. 663-675
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2015 ◽
Vol 14
(3)
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pp. 031212
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Keyword(s):
Keyword(s):
2000 ◽
Vol 18
(2)
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pp. 681-684
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Keyword(s):
Keyword(s):
2002 ◽
Vol 41
(Part 1, No. 6B)
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pp. 4122-4126