scholarly journals On Charge Carrier Density in Organic Solar Cells Obtained via Capacitance Spectroscopy

2020 ◽  
Vol 6 (10) ◽  
pp. 2000517
Author(s):  
Joachim Vollbrecht ◽  
Viktor V. Brus
AIP Advances ◽  
2019 ◽  
Vol 9 (12) ◽  
pp. 125205 ◽  
Author(s):  
Kyohei Nakano ◽  
Yujiao Chen ◽  
Keisuke Tajima

2012 ◽  
Vol 112 (4) ◽  
pp. 044502 ◽  
Author(s):  
Anil K. Thakur ◽  
Henri Baboz ◽  
Guillaume Wantz ◽  
Justin Hodgkiss ◽  
Lionel Hirsch

Author(s):  
Guillaume Celi ◽  
Sylvain Dudit ◽  
Thierry Parrassin ◽  
Philippe Perdu ◽  
Antoine Reverdy ◽  
...  

Abstract For Very Deep submicron Technologies, techniques based on the analysis of reflected laser beam properties are widely used. The Laser Voltage Imaging (LVI) technique, introduced in 2009, allows mapping frequencies through the backside of integrated circuit. In this paper, we propose a new technique based on the LVI technique to debug a scan chain related issue. We describe the method to use LVI, usually dedicated to frequency mapping of digital active parts, in a way that enables localization of resistive leakage. Origin of this signal is investigated on a 40nm case study. This signal can be properly understood when two different effects, charge carrier density variations (LVI) and thermo reflectance effect (Thermal Frequency Imaging, TFI), are taken into account.


2016 ◽  
Vol 120 (39) ◽  
pp. 22169-22178 ◽  
Author(s):  
Robert A. Street ◽  
Yang Yang ◽  
Barry C. Thompson ◽  
Iain McCulloch

2015 ◽  
Vol 119 (17) ◽  
pp. 9036-9040 ◽  
Author(s):  
Felix Herrmann ◽  
Burhan Muhsin ◽  
Chetan Raj Singh ◽  
Sviatoslav Shokhovets ◽  
Gerhard Gobsch ◽  
...  

ACS Omega ◽  
2018 ◽  
Vol 3 (11) ◽  
pp. 16328-16337 ◽  
Author(s):  
Stanley Bram ◽  
Matthew N. Gordon ◽  
Michael A. Carbonell ◽  
Maren Pink ◽  
Barry D. Stein ◽  
...  

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