scholarly journals Dependable Contact Related Parameter Extraction in Graphene–Metal Junctions

2020 ◽  
Vol 6 (10) ◽  
pp. 2000386
Author(s):  
Amit Gahoi ◽  
Satender Kataria ◽  
Francesco Driussi ◽  
Stefano Venica ◽  
Himadri Pandey ◽  
...  
Keyword(s):  
Parameter Extraction ◽  
Related Parameter

scholarly journals Device Parameter Extraction for Loss Analysis of Silicon Solar Cells Based on Intelligent Model Fitting

2018 ◽  
Vol 150 ◽  
pp. 21-27 ◽  
Author(s):  
Jian Wei Ho ◽  
Johnson Wong ◽  
Percis Teena Christopher Subhodayam ◽  
Kwan Bum Choi ◽  
Divya Ananthanarayanan ◽  
...  
Keyword(s):  
Solar Cells ◽  
Model Fitting ◽  
Parameter Extraction ◽  
Silicon Solar Cells ◽  
Loss Analysis ◽  
Device Parameter ◽  
Intelligent Model

scholarly journals Set-membership identifiability of nonlinear models and related parameter estimation properties

2016 ◽  
Vol 26 (4) ◽  
pp. 803-813 ◽  
Author(s):  
Carine Jauberthie ◽  
Louise Travé-MassuyèEs ◽  
Nathalie Verdière
Keyword(s):  
Mathematical Model ◽  
Parameter Estimation ◽  
Dynamic System ◽  
Nonlinear Models ◽  
Differential Algebra ◽  
Related Parameter ◽  
Set Membership ◽  
Estimation Problems ◽  
The Mathematical Model

Abstract Identifiability guarantees that the mathematical model of a dynamic system is well defined in the sense that it maps unambiguously its parameters to the output trajectories. This paper casts identifiability in a set-membership (SM) framework and relates recently introduced properties, namely, SM-identifiability, μ-SM-identifiability, and ε-SM-identifiability, to the properties of parameter estimation problems. Soundness and ε-consistency are proposed to characterize these problems and the solution returned by the algorithm used to solve them. This paper also contributes by carefully motivating and comparing SM-identifiability, μ-SM-identifiability and ε-SM-identifiability with related properties found in the literature, and by providing a method based on differential algebra to check these properties.

FIT/PVL circuit-parameter extraction for general electromagnetic devices

2000 ◽  
Vol 36 (4) ◽  
pp. 1421-1425 ◽  
Author(s):  
D. Ioan ◽  
T. Weiland ◽  
T. Wittig ◽  
I. Munteanu
Keyword(s):  
Parameter Extraction ◽  
Circuit Parameter ◽  
Electromagnetic Devices
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