General Resolution Enhancement Method in Atomic Force Microscopy Using Deep Learning

2018 ◽  
Vol 2 (2) ◽  
pp. 1800137 ◽  
Author(s):  
Yue Liu ◽  
Qiaomei Sun ◽  
Wanheng Lu ◽  
Hongli Wang ◽  
Yao Sun ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Deep Learning ◽  
Resolution Enhancement ◽  
Force Microscopy ◽  
Atomic Force ◽  
Enhancement Method

scholarly journals PM-19 Deep learning analysis of Si(111)-7x7 surface in atomic force microscopy

Microscopy ◽  
2019 ◽  
Vol 68 (Supplement_1) ◽  
pp. i44-i44
Author(s):  
Keiichi Ueda ◽  
Masayuki Abe
Keyword(s):  
Atomic Force Microscopy ◽  
Deep Learning ◽  
Force Microscopy ◽  
Atomic Force ◽  
Learning Analysis

scholarly journals Automated structure discovery in atomic force microscopy

2020 ◽  
Vol 6 (9) ◽  
pp. eaay6913 ◽  
Author(s):  
Benjamin Alldritt ◽  
Prokop Hapala ◽  
Niko Oinonen ◽  
Fedor Urtev ◽  
Ondrej Krejci ◽  
...  
Keyword(s):  
Molecular Structure ◽  
Atomic Force Microscopy ◽  
Deep Learning ◽  
High Resolution ◽  
Organic Molecules ◽  
Molecular Configuration ◽  
Force Microscopy ◽  
Aromatic Molecules ◽  
Atomic Force ◽  
Functionalized Tips

Atomic force microscopy (AFM) with molecule-functionalized tips has emerged as the primary experimental technique for probing the atomic structure of organic molecules on surfaces. Most experiments have been limited to nearly planar aromatic molecules due to difficulties with interpretation of highly distorted AFM images originating from nonplanar molecules. Here, we develop a deep learning infrastructure that matches a set of AFM images with a unique descriptor characterizing the molecular configuration, allowing us to predict the molecular structure directly. We apply this methodology to resolve several distinct adsorption configurations of 1S-camphor on Cu(111) based on low-temperature AFM measurements. This approach will open the door to applying high-resolution AFM to a large variety of systems, for which routine atomic and chemical structural resolution on the level of individual objects/molecules would be a major breakthrough.

Electrostatic Forces on the Surface of Metals as Measured by Atomic Force Microscopy

2000 ◽  
Vol 10 (1-2) ◽  
pp. 15
Author(s):  
Eugene Sprague ◽  
Julio C. Palmaz ◽  
Cristina Simon ◽  
Aaron Watson
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Forces ◽  
Force Microscopy ◽  
Atomic Force
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