Coding Metasurfaces for Diffuse Scattering: Scaling Laws, Bounds, and Suboptimal Design

2017 ◽  
Vol 5 (19) ◽  
pp. 1700455 ◽  
Author(s):  
Massimo Moccia ◽  
Shuo Liu ◽  
Rui Yuan Wu ◽  
Giuseppe Castaldi ◽  
Antonello Andreone ◽  
...  
Keyword(s):  
Diffuse Scattering ◽  
Scaling Laws ◽  
Suboptimal Design

Siphon Flows in Stratified Coronal Loops

1994 ◽  
Vol 144 ◽  
pp. 185-187
Author(s):  
S. Orlando ◽  
G. Peres ◽  
S. Serio
Keyword(s):  
Heat Flux ◽  
Scaling Laws ◽  
Flow Model ◽  
Supersonic Flows ◽  
Coronal Loops ◽  
Characteristic Parameters

AbstractWe have developed a detailed siphon flow model for coronal loops. We find scaling laws relating the characteristic parameters of the loop, explore systematically the space of solutions and show that supersonic flows are impossible for realistic values of heat flux at the base of the upflowing leg.

Calculation of structure images of crystalline defects

1978 ◽  
Vol 36 (1) ◽  
pp. 282-283
Author(s):  
M.A. O'Keefe ◽  
Sumio Iijima
Keyword(s):  
Diffuse Scattering ◽  
Computing Time ◽  
Continuous Distribution ◽  
Sampling Interval ◽  
Reciprocal Space ◽  
Objective Lens ◽  
Lattice Images ◽  
Slice Method ◽  
Space Cell ◽  
Beam Lattice

We have extended the multi-slice method of computating many-beam lattice images of perfect crystals to calculations for imperfect crystals using the artificial superlattice approach. Electron waves scattered from faulted regions of crystals are distributed continuously in reciprocal space, and all these waves interact dynamically with each other to give diffuse scattering patterns.In the computation, this continuous distribution can be sampled only at a finite number of regularly spaced points in reciprocal space, and thus finer sampling gives an improved approximation. The larger cell also allows us to defocus the objective lens further before adjacent defect images overlap, producing spurious computational Fourier images. However, smaller cells allow us to sample the direct space cell more finely; since the two-dimensional arrays in our program are limited to 128X128 and the sampling interval shoud be less than 1/2Å (and preferably only 1/4Å), superlattice sizes are limited to 40 to 60Å. Apart from finding a compromis superlattice cell size, computing time must be conserved.

Recent applications of TEM to the study of interfaces

1990 ◽  
Vol 48 (4) ◽  
pp. 308-309
Author(s):  
C. Barry Carter
Keyword(s):  
High Resolution ◽  
Sample Preparation ◽  
Grain Boundaries ◽  
Diffuse Scattering ◽  
Imaging Techniques ◽  
Amorphous Material ◽  
Contrast Imaging ◽  
Current State ◽  
Actual Nature ◽  
High Resolution Images

This paper will review the current state of understanding of interface structure and highlight some of the future needs and problems which must be overcome. The study of this subject can be separated into three different topics: 1) the fundamental electron microscopy aspects, 2) material-specific features of the study and 3) the characteristics of the particular interfaces. The two topics which are relevant to most studies are the choice of imaging techniques and sample preparation. The techniques used to study interfaces in the TEM include high-resolution imaging, conventional diffraction-contrast imaging, and phase-contrast imaging (Fresnel fringe images, diffuse scattering). The material studied affects not only the characteristics of the interfaces (through changes in bonding, etc.) but also the method used for sample preparation which may in turn have a significant affect on the resulting image. Finally, the actual nature and geometry of the interface must be considered. For example, it has become increasingly clear that the plane of the interface is particularly important whenever at least one of the adjoining grains is crystalline.A particularly productive approach to the study of interfaces is to combine different imaging techniques as illustrated in the study of grain boundaries in alumina. In this case, the conventional imaging approach showed that most grain boundaries in ion-thinned samples are grooved at the grain boundary although the extent of this grooving clearly depends on the crystallography of the surface. The use of diffuse scattering (from amorphous regions) gives invaluable information here since it can be used to confirm directly that surface grooving does occur and that the grooves can fill with amorphous material during sample preparation (see Fig. 1). Extensive use of image simulation has shown that, although information concerning the interface can be obtained from Fresnel-fringe images, the introduction of artifacts through sample preparation cannot be lightly ignored. The Fresnel-fringe simulation has been carried out using a commercial multislice program (TEMPAS) which was intended for simulation of high-resolution images.

Equilibrium scaling laws for layered spin glasses

1993 ◽  
Vol 3 (10) ◽  
pp. 2041-2062 ◽  
Author(s):  
M. J. Thill ◽  
H. J. Hilhorst
Keyword(s):  
Spin Glasses ◽  
Scaling Laws ◽  
Layered Spin

POLARIZATION ANALYSIS OF THE MAGNETIC DIFFUSE SCATTERING OF Na3Cr2P3O12

1988 ◽  
Vol 49 (C8) ◽  
pp. C8-199-C8-200
Author(s):  
N. Fanjat ◽  
O. Schaerpf ◽  
J. L. Soubeyroux ◽  
A. J. Dianoux ◽  
G. Lucazeau
Keyword(s):  
Diffuse Scattering ◽  
Polarization Analysis

A neutron-diffraction study of potassium bromide

1973 ◽  
Vol 137 (4) ◽  
Author(s):  
G. E. Bacon ◽  
D. H. Titterton ◽  
C. R. Walker
Keyword(s):  
Neutron Diffraction ◽  
Diffraction Data ◽  
Diffuse Scattering ◽  
Scattering Amplitude ◽  
Coherent Scattering ◽  
Neutron Diffraction Study ◽  
Potassium Bromide ◽  
Neutron Diffraction Data ◽  
Thermal Diffuse Scattering ◽  
Thermal Diffuse

AbstractNeutron-diffraction data have been collected from a KBr single crystal. 380 reflections were measured, reducing to 23 when averaged over equivalents. Data were corrected for extinction and thermal diffuse scattering and refinement yielded a neutron coherent scattering amplitude

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