scholarly journals Ultrafast Laser-Induced Metasurfaces for Geometric Phase Manipulation

2016 ◽  
Vol 5 (1) ◽  
pp. 1600575 ◽  
Author(s):  
Rokas Drevinskas ◽  
Martynas Beresna ◽  
Jingyu Zhang ◽  
Andrey G. Kazanskii ◽  
Peter G. Kazansky
Keyword(s):  
Geometric Phase ◽  
Ultrafast Laser ◽  
Phase Manipulation

Ultrafast laser-inscribed nanogratings in sapphire for geometric phase elements

2020 ◽  
Author(s):  
Shuai Xu ◽  
Hua Fan ◽  
Zhen-Ze Li ◽  
Jian-Guan Hua ◽  
Yan-Hao Yu ◽  
...  
Keyword(s):  
Geometric Phase ◽  
Ultrafast Laser

scholarly journals Ultralow-loss geometric phase and polarization shaping by ultrafast laser writing in silica glass

2020 ◽  
Vol 9 (1) ◽  
Author(s):  
Masaaki Sakakura ◽  
Yuhao Lei ◽  
Lei Wang ◽  
Yan-Hao Yu ◽  
Peter G. Kazansky
Keyword(s):  
Silica Glass ◽  
Geometric Phase ◽  
Ultrafast Laser ◽  
Laser Writing

scholarly journals Silicon Metasurfaces for Third Harmonic Geometric Phase Manipulation and Multiplexed Holography

Nano Letters ◽  
2019 ◽  
Vol 19 (9) ◽  
pp. 6585-6591 ◽  
Author(s):  
Bernhard Reineke ◽  
Basudeb Sain ◽  
Ruizhe Zhao ◽  
Luca Carletti ◽  
Bingyi Liu ◽  
...  
Keyword(s):  
Geometric Phase ◽  
Third Harmonic ◽  
Phase Manipulation

Implementation of Quantum Level Addressability and Geometric Phase Manipulation in Aligned Endohedral Fullerene Qudits

2021 ◽  
Author(s):  
Shang-Da Jiang ◽  
Shen Zhou ◽  
Jiayue Yuan ◽  
Zi-Yu Wang ◽  
Kun Ling ◽  
...  
Keyword(s):  
Geometric Phase ◽  
Quantum Level ◽  
Endohedral Fullerene ◽  
Phase Manipulation

Ultrafast laser processing of ceramics: Comprehensive survey of laser parameters

2021 ◽  
Vol 33 (1) ◽  
pp. 012009
Author(s):  
Aiko Narazaki ◽  
Hideyuki Takada ◽  
Dai Yoshitomi ◽  
Kenji Torizuka ◽  
Yohei Kobayashi
Keyword(s):  
Laser Processing ◽  
Ultrafast Laser ◽  
Laser Parameters ◽  
Comprehensive Survey

Local Lattice Strain Measurement Using Geometric Phase Analysis of Dark Field Images from Scanning Transmission Electron Microscopy

2011 ◽  
Author(s):  
Jayhoon Chung ◽  
Guoda Lian ◽  
Lew Rabenberg
Keyword(s):  
Phase Analysis ◽  
Geometric Phase ◽  
Process Development ◽  
Local Strain ◽  
Strain Engineering ◽  
Dark Field ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Geometric Phase Analysis ◽  
Scanning Transmission

Abstract Since strain engineering plays a key role in semiconductor technology development, a reliable and reproducible technique to measure local strain in devices is necessary for process development and failure analysis. In this paper, geometric phase analysis of high angle annular dark field - scanning transmission electron microscope images is presented as an effective technique to measure local strains in the current node of Si based transistors.

Progress in ultrafast laser space-selective welding

2020 ◽  
Vol 13 (6) ◽  
pp. 1-15
Author(s):  
ZHANG Guo-dong ◽  
◽  
CHENG Guang-hua ◽  
ZHANG Wei ◽  
Keyword(s):  
Ultrafast Laser
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