An Ultradurable and Uniform Cu Electrode by Blending Carbon Nanotube Fillers in Copper-Based Metal-Organic Decomposition Ink for Flexible Printed Electronics

2018 ◽  
Vol 5 (16) ◽  
pp. 1800502 ◽  
Author(s):  
Kwang-dong Seong ◽  
Jong Min Kim ◽  
Jeongmin Kang ◽  
Minsik Hwang ◽  
Chaedong Lee ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Printed Electronics ◽  
Metal Organic ◽  
Organic Decomposition

A Self-Reducible and Alcohol-Soluble Copper-Based Metal–Organic Decomposition Ink for Printed Electronics

2014 ◽  
Vol 6 (5) ◽  
pp. 3312-3319 ◽  
Author(s):  
Dong-Hun Shin ◽  
Seunghee Woo ◽  
Hyesuk Yem ◽  
Minjeong Cha ◽  
Sanghun Cho ◽  
...  
Keyword(s):  
Printed Electronics ◽  
Metal Organic ◽  
Organic Decomposition

A low temperature and air-sinterable copper–diamine complex-based metal organic decomposition ink for printed electronics

2018 ◽  
Vol 6 (24) ◽  
pp. 6406-6415 ◽  
Author(s):  
Yue Dong ◽  
Zhijie Lin ◽  
Xiaodong Li ◽  
Qi Zhu ◽  
Ji-Guang Li ◽  
...  
Keyword(s):  
Low Temperature ◽  
Printed Electronics ◽  
Cu Films ◽  
Air Atmosphere ◽  
Metal Organic ◽  
Organic Decomposition

A Cu–diamine formulated ink for obtaining flexible conductive Cu films in an air atmosphere at temperatures as low as 130 °C.

scholarly journals Metal−Organic Decomposition Ink for Printed Electronics

2019 ◽  
Vol 6 (20) ◽  
pp. 1901002 ◽  
Author(s):  
Yejung Choi ◽  
Kwang‐dong Seong ◽  
Yuanzhe Piao
Keyword(s):  
Printed Electronics ◽  
Metal Organic ◽  
Organic Decomposition

High copper loading metal organic decomposition paste for printed electronics

2017 ◽  
Vol 52 (10) ◽  
pp. 5617-5625 ◽  
Author(s):  
Sze Kee Tam ◽  
Ka Yip Fung ◽  
Ka Ming Ng
Keyword(s):  
Printed Electronics ◽  
High Copper ◽  
Metal Organic ◽  
Organic Decomposition

Charge Trapping and Degradation Properties of PZT Thin Films for MEMS

1996 ◽  
Vol 444 ◽  
Author(s):  
Hyeon-Seag Kim ◽  
D. L. Polla ◽  
S. A. Campbell
Keyword(s):  
Thin Films ◽  
Loss Factor ◽  
High Field ◽  
Microelectromechanical Systems ◽  
Charge Trapping ◽  
Metal Organic ◽  
Electrical Reliability ◽  
Silicon Based ◽  
Degradation Properties ◽  
Organic Decomposition

AbstractThe electrical reliability properties of PZT (54/46) thin films have been measured for the purpose of integrating this material with silicon-based microelectromechanical systems. Ferroelectric thin films of PZT were prepared by metal organic decomposition. The charge trapping and degradation properties of these thin films were studied through device characteristics such as hysteresis loop, leakage current, fatigue, dielectric constant, capacitancevoltage, and loss factor measurements. Several unique experimental results have been found. Different degradation processes were verified through fatigue (bipolar stress), low and high charge injection (unipolar stress), and high field stressing (unipolar stress).

A Metal–Organic Gel-Carbon Nanotube Nanocomposite for Electrochemical Detection of Nitrite

2021 ◽  
Vol 3 (2) ◽  
pp. 761-768
Author(s):  
Fan Ding ◽  
Ge Zhang ◽  
Chenpu Chen ◽  
Shujing Jiang ◽  
Hao Tang ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Electrochemical Detection ◽  
Metal Organic ◽  
Organic Gel
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