Carrier Multiplication in PbS Quantum Dots Anchored on a Au Tip using Conductive Atomic Force Microscopy

Sung‐Tae Kim; Ji‐Hee Kim; Young Hee Lee

doi:10.1002/adma.201908461

Carrier Multiplication in PbS Quantum Dots Anchored on a Au Tip using Conductive Atomic Force Microscopy

Advanced Materials ◽

10.1002/adma.201908461 ◽

2020 ◽

Vol 32 (17) ◽

pp. 1908461 ◽

Cited By ~ 1

Author(s):

Sung‐Tae Kim ◽

Ji‐Hee Kim ◽

Young Hee Lee

Keyword(s):

Quantum Dots ◽

Atomic Force Microscopy ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Carrier Multiplication ◽

Pbs Quantum Dots

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Carrier multiplication in PbS quantum dots anchored on Au tip using conductive atomic force microscopy

New Concepts in Solar and Thermal Radiation Conversion III ◽

10.1117/12.2577345 ◽

2020 ◽

Author(s):

Sung-Tae Kim

Keyword(s):

Quantum Dots ◽

Atomic Force Microscopy ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Carrier Multiplication ◽

Pbs Quantum Dots

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PbS Quantum Dots: Carrier Multiplication in PbS Quantum Dots Anchored on a Au Tip using Conductive Atomic Force Microscopy (Adv. Mater. 17/2020)

Advanced Materials ◽

10.1002/adma.202070130 ◽

2020 ◽

Vol 32 (17) ◽

pp. 2070130

Author(s):

Sung‐Tae Kim ◽

Ji‐Hee Kim ◽

Young Hee Lee

Keyword(s):

Quantum Dots ◽

Atomic Force Microscopy ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Carrier Multiplication ◽

Pbs Quantum Dots

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Effects of a native oxide layer on the conductive atomic force microscopy measurements of self-assembled Ge quantum dots

Nanotechnology ◽

10.1088/0957-4484/17/20/012 ◽

2006 ◽

Vol 17 (20) ◽

pp. 5111-5116 ◽

Cited By ~ 21

Author(s):

R Wu ◽

F H Li ◽

Z M Jiang ◽

X J Yang

Keyword(s):

Quantum Dots ◽

Atomic Force Microscopy ◽

Oxide Layer ◽

Native Oxide ◽

Native Oxide Layer ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Ge Quantum Dots ◽

Self Assembled

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Atomic force microscopy and optical characterization of PbS quantum dots grown in glass matrix

Microelectronics Journal ◽

10.1016/s0026-2692(03)00083-1 ◽

2003 ◽

Vol 34 (5-8) ◽

pp. 647-649 ◽

Cited By ~ 5

Author(s):

R.S. Silva ◽

F. Qu ◽

A.M. Alcalde ◽

N.O. Dantas

Keyword(s):

Quantum Dots ◽

Atomic Force Microscopy ◽

Glass Matrix ◽

Optical Characterization ◽

Force Microscopy ◽

Atomic Force ◽

Pbs Quantum Dots

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Increased conductance of individual self-assembled GeSi quantum dots by inter-dot coupling studied by conductive atomic force microscopy

Nanoscale Research Letters ◽

10.1186/1556-276x-7-278 ◽

2012 ◽

Vol 7 (1) ◽

pp. 278 ◽

Cited By ~ 2

Author(s):

Yifei Zhang ◽

Fengfeng Ye ◽

Jianhui Lin ◽

Zuimin Jiang ◽

Xinju Yang

Keyword(s):

Quantum Dots ◽

Atomic Force Microscopy ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Self Assembled ◽

Individual Self

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Bias-dependent conductive characteristics of individual GeSi quantum dots studied by conductive atomic force microscopy

Nanotechnology ◽

10.1088/0957-4484/22/9/095708 ◽

2011 ◽

Vol 22 (9) ◽

pp. 095708 ◽

Cited By ~ 6

Author(s):

R Wu ◽

S L Zhang ◽

J H Lin ◽

Z M Jiang ◽

X J Yang

Keyword(s):

Quantum Dots ◽

Atomic Force Microscopy ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

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Conductive atomic force microscopy studies on the transformation of GeSi quantum dots to quantum rings

Nanotechnology ◽

10.1088/0957-4484/20/13/135703 ◽

2009 ◽

Vol 20 (13) ◽

pp. 135703 ◽

Cited By ~ 11

Author(s):

S L Zhang ◽

F Xue ◽

R Wu ◽

J Cui ◽

Z M Jiang ◽

...

Keyword(s):

Quantum Dots ◽

Atomic Force Microscopy ◽

Conductive Atomic Force Microscopy ◽

Quantum Rings ◽

Force Microscopy ◽

Atomic Force

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A direct investigation of photocharge transfer across monomolecular layer between C60and CdS quantum dots by photoassisted conductive atomic force microscopy

AIP Advances ◽

10.1063/1.4947571 ◽

2016 ◽

Vol 6 (4) ◽

pp. 045012

Author(s):

Xiaohong Jiang ◽

He Liu ◽

Xingtang Zhang ◽

Gang Cheng ◽

Shujie Wang ◽

...

Keyword(s):

Quantum Dots ◽

Atomic Force Microscopy ◽

Cds Quantum Dots ◽

Conductive Atomic Force Microscopy ◽

Monomolecular Layer ◽

Force Microscopy ◽

Atomic Force ◽

Direct Investigation

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Imaging the electric properties of InAs∕InP(001) quantum dots capped with a thin InP layer by conductive atomic force microscopy: Evidence of memory effect

Applied Physics Letters ◽

10.1063/1.2349288 ◽

2006 ◽

Vol 89 (11) ◽

pp. 112115 ◽

Cited By ~ 17

Author(s):

K. Smaali ◽

M. Troyon ◽

A. El Hdiy ◽

M. Molinari ◽

G. Saint-Girons ◽

...

Keyword(s):

Quantum Dots ◽

Atomic Force Microscopy ◽

Memory Effect ◽

Electric Properties ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

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Studying the lateral composition in Ge quantum dots on Si(001) by conductive atomic force microscopy

Surface Science ◽

10.1016/j.susc.2005.06.082 ◽

2005 ◽

Vol 592 (1-3) ◽

pp. 65-71 ◽

Cited By ~ 24

Author(s):

F. Xue ◽

J. Qin ◽

J. Cui ◽

Y.L. Fan ◽

Z.M. Jiang ◽

...

Keyword(s):

Quantum Dots ◽

Atomic Force Microscopy ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Ge Quantum Dots

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