Single Electron Gating of Topological Insulators

Paolo Sessi; Thomas Bathon; Konstantin Aleksandrovich Kokh; Oleg Evgenievich Tereshchenko; Matthias Bode

doi:10.1002/adma.201602413

Single Electron Gating of Topological Insulators

Advanced Materials ◽

10.1002/adma.201602413 ◽

2016 ◽

Vol 28 (45) ◽

pp. 10073-10078 ◽

Cited By ~ 6

Author(s):

Paolo Sessi ◽

Thomas Bathon ◽

Konstantin Aleksandrovich Kokh ◽

Oleg Evgenievich Tereshchenko ◽

Matthias Bode

Keyword(s):

Topological Insulators ◽

Single Electron ◽

Electron Gating

Download Full-text

Evaluation of single-electron movies of glutamine synthetase molecules

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100075191 ◽

1983 ◽

Vol 41 ◽

pp. 280-281

Author(s):

W. Kunath ◽

E. Zeitler ◽

M. Kessel

Keyword(s):

Electron Microscope ◽

Glutamine Synthetase ◽

Electron Irradiation ◽

Structural Damage ◽

Structural Changes ◽

Single Electron ◽

Continuous Series ◽

Digital Recording ◽

Recording Device ◽

Low Exposure

The features of digital recording of a continuous series (movie) of singleelectron TV frames are reported. The technique is used to investigate structural changes in negatively stained glutamine synthetase molecules (GS) during electron irradiation and, as an ultimate goal, to look for the molecules' “undamaged” structure, say, after a 1 e/Å2 dose.The TV frame of fig. la shows an image of 5 glutamine synthetase molecules exposed to 1/150 e/Å2. Every single electron is recorded as a unit signal in a 256 ×256 field. The extremely low exposure of a single TV frame as dictated by the single-electron recording device including the electron microscope requires accumulation of 150 TV frames into one frame (fig. lb) thus achieving a reasonable compromise between the conflicting aspects of exposure time per frame of 3 sec. vs. object drift of less than 1 Å, and exposure per frame of 1 e/Å2 vs. rate of structural damage.

Download Full-text

Single-electron sensitivity with a lens-coupled CCD camera

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100149040 ◽

1993 ◽

Vol 51 ◽

pp. 642-643

Author(s):

G.Y. Fan ◽

Bruce Mrosko ◽

Mark H. Ellisman

Keyword(s):

Focal Length ◽

Thick Layer ◽

Ccd Camera ◽

Single Electron ◽

Bottom Flange ◽

X Rays ◽

Red Phosphor ◽

Ccd Detector ◽

Lens Assembly ◽

Efficient Coupling

A lens coupled CCD camera showing single electron sensitivity has been built for TEM applications. The design is illustrated in Fig. 1. The bottom flange of a JEM-4000EX microscope is replaced by a special flange which carries a large rectangular leaded glass window, 22 mm thick. A 20 μm thick layer of red phosphor is coated on the window, and the entire window is sputter-coated with a thin layer of Au/Pt. A two-lens relay system is used to provide efficient coupling between the image on the phosphor scintillator and the CCD imager. An f1.0 lens (Goerz optical) with front focal length 71.6 mm is used as the collector. A mirror prism, of the Amici type, is used to "bend" the optical path by 90° to prevent X-rays which may penetrate the leaded glass from hitting the CCD detector. Images may be relayed directly to the camera (1:1) or demagnified by a factor of up to 3:1 by moving the lens assembly.

Download Full-text