Secondary Ion Mass Spectrometry (SIMS) for Chemical Characterization of Metal Halide Perovskites

Yongtao Liu; Matthias Lorenz; Anton V. Ievlev; Olga S. Ovchinnikova

doi:10.1002/adfm.202002201

Secondary Ion Mass Spectrometry (SIMS) for Chemical Characterization of Metal Halide Perovskites

Advanced Functional Materials ◽

10.1002/adfm.202002201 ◽

2020 ◽

Vol 30 (35) ◽

pp. 2002201 ◽

Cited By ~ 7

Author(s):

Yongtao Liu ◽

Matthias Lorenz ◽

Anton V. Ievlev ◽

Olga S. Ovchinnikova

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Chemical Characterization ◽

Metal Halide ◽

Ion Mass Spectrometry ◽

Halide Perovskites ◽

Secondary Ion

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Secondary ion mass spectrometry/digital imaging for the three‐dimensional chemical characterization of solid state devices

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.573263 ◽

1985 ◽

Vol 3 (6) ◽

pp. 2102-2107 ◽

Cited By ~ 16

Author(s):

S. R. Bryan ◽

W. S. Woodward ◽

R. W. Linton ◽

D. P. Griffis

Keyword(s):

Mass Spectrometry ◽

Solid State ◽

Digital Imaging ◽

Secondary Ion Mass Spectrometry ◽

Three Dimensional ◽

Chemical Characterization ◽

Solid State Devices ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Chemical characterization of industrial steel and aluminium sheet surfaces by secondary ion mass spectrometry, glow discharge optical spectroscopy and other surface-sensitive techniques

Materials Science and Engineering ◽

10.1016/0025-5416(80)90040-3 ◽

1980 ◽

Vol 42 ◽

pp. 309-320 ◽

Cited By ~ 28

Author(s):

E. Janssen

Keyword(s):

Mass Spectrometry ◽

Glow Discharge ◽

Optical Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Chemical Characterization ◽

Aluminium Sheet ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Visualization and Chemical Characterization of the Cathode Electrolyte Interphase Using He-Ion Microscopy and In Situ Time-of-Flight Secondary Ion Mass Spectrometry

ACS Applied Energy Materials ◽

10.1021/acsaem.0c01333 ◽

2020 ◽

Vol 3 (9) ◽

pp. 8822-8832

Author(s):

Laura Wheatcroft ◽

Nico Klingner ◽

René Heller ◽

Gregor Hlawacek ◽

Doğan Özkaya ◽

...

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Chemical Characterization ◽

Ion Mass Spectrometry ◽

Ion Microscopy ◽

Secondary Ion

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Detection of Au+ Ions During Fluorine Gas-Assisted Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for the Complete Elemental Characterization of Microbatteries

ACS Applied Materials & Interfaces ◽

10.1021/acsami.1c10352 ◽

2021 ◽

Vol 13 (34) ◽

pp. 41262-41274

Author(s):

Agnieszka Priebe ◽

Jordi Sastre ◽

Moritz H. Futscher ◽

Jakub Jurczyk ◽

Marcos V. Puydinger dos Santos ◽

...

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Elemental Characterization

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Forensic Characterization of Lipsticks Using Time-of-Flight Secondary Ion Mass Spectrometry

Journal of Analytical Chemistry ◽

10.1134/s1061934821070091 ◽

2021 ◽

Vol 76 (7) ◽

pp. 854-867

Author(s):

Jihye Lee ◽

Yeonhee Lee

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Secondary ion mass spectrometry (SIMS) applications on characterization of RF NPN bipolar polysilicon emitter process

10.1063/1.52570 ◽

1997 ◽

Cited By ~ 2

Author(s):

S. Lu

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Mass Spectrometry ◽

Polysilicon Emitter ◽

Secondary Ion

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Characterization of sequentially grafted polysaccharide coatings using time-of-flight secondary ion mass spectrometry (ToF-SIMS) and principal component analysis (PCA)

Surface and Interface Analysis ◽

10.1002/sia.1446 ◽

2002 ◽

Vol 33 (12) ◽

pp. 924-931 ◽

Cited By ~ 13

Author(s):

Sally L. McArthur ◽

Matthew S. Wagner ◽

Patrick G. Hartley ◽

Keith M. McLean ◽

Hans J. Griesser ◽

...

Keyword(s):

Mass Spectrometry ◽

Principal Component Analysis ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Principal Component ◽

Component Analysis ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Characterization of S-glass/polysulfone adhesive failure using ion scattering spectroscopy and secondary ion mass spectrometry

Journal of Colloid and Interface Science ◽

10.1016/0021-9797(80)90178-2 ◽

1980 ◽

Vol 74 (1) ◽

pp. 150-162 ◽

Cited By ~ 26

Author(s):

Anthony T Dibenedetto ◽

Daniel A Scola

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Adhesive Failure ◽

Ion Scattering ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Characterization of the superlattice region of a quantum cascade laser by secondary ion mass spectrometry

Nanoscale ◽

10.1039/c7nr06401b ◽

2017 ◽

Vol 9 (44) ◽

pp. 17571-17575 ◽

Cited By ~ 8

Author(s):

Paweł Piotr Michałowski ◽

Piotr Gutowski ◽

Dorota Pierścińska ◽

Kamil Pierściński ◽

Maciej Bugajski ◽

...

Keyword(s):

Mass Spectrometry ◽

Quantum Cascade Laser ◽

Secondary Ion Mass Spectrometry ◽

Quantum Cascade ◽

Oxygen Contamination ◽

Ion Mass Spectrometry ◽

Secondary Ion

Non-uniform oxygen contamination in the superlattice region of a quantum cascade laser measured by secondary ion mass spectrometry.

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Purification of Cu by hydrogen plasma-arc zone melting and characterization of trace impurities by secondary ion mass spectrometry

Materials Characterization ◽

10.1016/j.matchar.2008.05.004 ◽

2009 ◽

Vol 60 (1) ◽

pp. 60-64 ◽

Cited By ~ 5

Author(s):

G.M. Lalev ◽

J.-W. Lim ◽

N.R. Munirathnam ◽

G.-S. Choi ◽

M. Uchikoshi ◽

...

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Hydrogen Plasma ◽

Zone Melting ◽

Plasma Arc ◽

Trace Impurities ◽

Ion Mass Spectrometry ◽

Secondary Ion

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