scholarly journals Ferroelectrics: Universality of Polarization Switching Dynamics in Ferroelectric Capacitors Revealed by 5D Piezoresponse Force Microscopy (Adv. Funct. Mater. 32/2013)

2013 ◽  
Vol 23 (32) ◽  
pp. 3945-3945
Author(s):  
Yunseok Kim ◽  
Xiaoli Lu ◽  
Stephen Jesse ◽  
Dietrich Hesse ◽  
Marin Alexe ◽  
...  
Keyword(s):  
Piezoresponse Force Microscopy ◽  
Polarization Switching ◽  
Force Microscopy ◽  
Switching Dynamics ◽  
Ferroelectric Capacitors

Universality of Polarization Switching Dynamics in Ferroelectric Capacitors Revealed by 5D Piezoresponse Force Microscopy

2013 ◽  
Vol 23 (32) ◽  
pp. 3971-3979 ◽  
Author(s):  
Yunseok Kim ◽  
Xiaoli Lu ◽  
Stephen Jesse ◽  
Dietrich Hesse ◽  
Marin Alexe ◽  
...  
Keyword(s):  
Piezoresponse Force Microscopy ◽  
Polarization Switching ◽  
Force Microscopy ◽  
Switching Dynamics ◽  
Ferroelectric Capacitors

Nanoelectromechanics of Piezoresponse Force Microscopy: Contact Properties, Fields Below the Surface and Polarization Switching

2003 ◽  
Vol 784 ◽  
Author(s):  
S. V. Kalinin ◽  
Junsoo Shin ◽  
M. Kachanov ◽  
E. Karapetian ◽  
A. P. Baddorf
Keyword(s):  
Strain Distribution ◽  
Point Charge ◽  
Closed Form Solution ◽  
Piezoresponse Force Microscopy ◽  
Polarization Switching ◽  
Ferroelectric Material ◽  
Form Solution ◽  
Force Microscopy ◽  
Force Magnitude ◽  
Resolution Limits

ABSTRACTTo achieve quantitative interpretation of Piezoresponse Force Microscopy (PFM), including resolution limits, tip bias- and strain-induced phenomena and spectroscopy, knowledge of elastic and electrostatic field distributions below the tip is required. The exact closed form solution of the coupled electroelastic problem for piezoelectric indentation is derived and used to obtain the tip-induced electric field and strain distribution in the ferroelectric material. This establishes a complete continuum mechanics description of the PFM imaging mechanism. These solutions are reduced to the point charge/force behavior for large separations from contact, and the applicability limits and charge/force magnitude for these models are established. The implications of these results for ferroelectric polarization switching processes are analyzed.

Structure and Nanoscale Polarization Switching Induced by High Frequency Alternating Current in PbTiO3 Polycrystalline Films

2014 ◽  
Vol 687-691 ◽  
pp. 4395-4398
Author(s):  
Hui Fen Guo ◽  
Shu Xia Guo
Keyword(s):  
Perovskite Phase ◽  
Sol Gel ◽  
Piezoresponse Force Microscopy ◽  
Polarization Switching ◽  
Alternating Current ◽  
Polycrystalline Materials ◽  
Cooperative Action ◽  
Force Microscopy ◽  
Average Grain Size ◽  
Individual Grains

PbTiO3(PTO) films were successfully fabricated by sol-gel method. We studied the structure and the nanoscale polarization switching property using XRD and Piezoresponse Force Microscopy. The results reveal that the PTO films are single perovskite phase grain films with tetragonal structure, and are polycrystalline materials with no evidence of preferential orientation. The average grain size is about 150nm and a striped multi-domain structure is exhibited in individual grains. Under 15 kHz alternating current of PFM, a significant asymmetry of switching pattern was observed. We suggest that the cooperative action of the built-in electric field at the bottom interface and the PFM ac-voltage lead to the asymmetry switching.

scholarly journals Atomic force microscopy-based experimental setup for studying domain switching dynamics in ferroelectric capacitors

2005 ◽  
Vol 76 (2) ◽  
pp. 023708 ◽  
Author(s):  
C. Dehoff ◽  
B. J. Rodriguez ◽  
A. I. Kingon ◽  
R. J. Nemanich ◽  
A. Gruverman ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Domain Switching ◽  
Experimental Setup ◽  
Force Microscopy ◽  
Atomic Force ◽  
Switching Dynamics ◽  
Ferroelectric Capacitors

scholarly journals Studying the Polarization Switching in Polycrystalline BiFeO3 Films by 2D Piezoresponse Force Microscopy

2015 ◽  
Vol 5 (1) ◽  
Author(s):  
Yaming Jin ◽  
Xiaomei Lu ◽  
Junting Zhang ◽  
Yi Kan ◽  
Huifeng Bo ◽  
...  
Keyword(s):  
Piezoresponse Force Microscopy ◽  
Polarization Switching ◽  
Force Microscopy
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