Determination of Fiber Size Distributions of Injection Moulded Polypropylene/Natural Fibers Using X-ray Microtomography

2008 ◽  
Vol 10 (1-2) ◽  
pp. 126-130 ◽  
Author(s):  
A. Alemdar ◽  
H. Zhang ◽  
M. Sain ◽  
G. Cescutti ◽  
J. Müssig
Keyword(s):  
Natural Fibers ◽  
Size Distributions ◽  
X Ray ◽  
Fiber Size

scholarly journals Determination of size distributions of non-spherical pores or particles from single x-ray phase contrast images

2019 ◽  
Vol 27 (12) ◽  
pp. 17322
Author(s):  
A. F. T. Leong ◽  
E. Asare ◽  
R. Rex ◽  
X. H. Xiao ◽  
K. T. Ramesh ◽  
...  
Keyword(s):  
Phase Contrast ◽  
Size Distributions ◽  
X Ray

scholarly journals FXD-CSD-GUI: a graphical user interface for the X-ray-diffraction-based determination of crystallite size distributions

2019 ◽  
Vol 52 (6) ◽  
pp. 1437-1439
Author(s):  
Sigmund H. Neher ◽  
Helmut Klein ◽  
Werner F. Kuhs
Keyword(s):  
User Interface ◽  
Graphical User Interface ◽  
Crystal Size ◽  
Data Handling ◽  
Size Distributions ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
X Ray ◽  
User Friendly

Bragg intensities can be used to analyse crystal size distributions in a method called FXD-CSD, which is based on the fast measurement of many Bragg spots using two-dimensional detectors. This work presents the Python-based software and its graphical user interface FXD-CSD-GUI. The GUI enables user-friendly data handling and processing and provides both graphical and numerical crystal size distribution results.

Diffuse X-Ray Scattering for the Study of Defects in Silicon

1980 ◽  
Vol 2 ◽  
Author(s):  
BC Larson ◽  
JF Barhorst
Keyword(s):  
Diffuse Scattering ◽  
Analytical Models ◽  
Size Distributions ◽  
Dislocation Loops ◽  
Crystalline Materials ◽  
X Ray ◽  
Analysis Techniques ◽  
Defect Clusters ◽  
X Ray Scattering

ABSTRACTX-ray diffuse scattering can be used to study the size, concentration, and nature of lattice defects and defect clusters in crystalline materials. The availability of analytical models and detailed numerical calculations for the “Huang” diffuse scattering close to Bragg reflections and the “asymptotic” diffuse scattering at somewhat larger distances from Bragg reflections has made it possible to carry out detailed analyses of the intensity and angular distribution of the diffuse scattering in terms of specific defect parameters. Accordingly, diffuse scattering has been used to study point defects, dislocation loops, and precipitates in metals, semiconductors, and insulators and has provided information on defect geometries, size distributions, and concentrations. In this paper, the theoretical framework necessary for the interpretation of the “Huang” and “asymptotic” diffuse scattering from defect clusters is presented and examples of diffuse scattering calculations for defects in silicon are given. Diffuse scattering from clustered defects in silicon is discussed in terms of the type of information available from this scattering and the relative merits of diffuse scattering as an investigative tool for defect clusters. Diffuse scattering analysis techniques for the determination of separate size distributions for vacancy and interstitial dislocation loops in silicon are presented and applied to diffuse scattering measurements on neutron irradiated silicon. Dislocation loop densities and sizes determined in the as-irradiated state and after thermal anneals are compared with electron microscopy results.

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