Residual Stress Analysis by Monochromatic High-Energy X-rays

2017 ◽  
pp. 145-160
Author(s):  
René V. Martins
Keyword(s):  
Residual Stress ◽  
Stress Analysis ◽  
High Energy ◽  
X Rays ◽  
Residual Stress Analysis

scholarly journals Depth-Resolved Residual Stress Analysis with High-Energy Synchrotron X-Rays Using a Conical Slit Cell

2013 ◽  
Vol 768-769 ◽  
pp. 72-75 ◽  
Author(s):  
Peter Staron ◽  
Torben Fischer ◽  
Jozef Keckes ◽  
Sonja Schratter ◽  
Thomas Hatzenbichler ◽  
...  
Keyword(s):  
Residual Stress ◽  
Stress Analysis ◽  
Cross Sections ◽  
Materials Science ◽  
Steel Wire ◽  
High Energy ◽  
X Rays ◽  
Energy Materials ◽  
Residual Stress Analysis ◽  
Good Agreement

A conical slit cell for depth-resolved diffraction of high-energy X-rays was used for residual stress analysis at the high-energy materials science synchrotron beamline HEMS at PETRA III. With a conical slit width of 20 µm and beam cross-sections of 50 µm, a spatial resolution in beam direction of 0.8 mm was achieved. The setup was used for residual stress analysis in a drawn steel wire with 8.3 mm diameter. The residual stress results were in very good agreement with results of a FE simulation.

Neutron Surface Residual Stress Scanning Using Optimisation of a Si Bent Perfect Crystal Monochromator for Minimising Spurious Strains

2011 ◽  
Vol 681 ◽  
pp. 399-404 ◽  
Author(s):  
Joana Rebelo-Kornmeier ◽  
Jens Gibmeier ◽  
Michael Hofmann ◽  
Robert C. Wimpory
Keyword(s):  
Residual Stress ◽  
Stress Analysis ◽  
Surface Effect ◽  
Stress Gradient ◽  
High Energy ◽  
Surface Strain ◽  
X Rays ◽  
Surface Residual Stress ◽  
Gauge Volume ◽  
Residual Strains

For non destructive stress analysis of surface treated steel samples the application of laboratory X rays or high energy synchrotron radiation in reflection mode covers the region from some micrometers up to a depth of about 150 - 200 µm. To access depth regions deeper than 200 µm the incremental layer removal technique in combination with the repeated application of X‑ray stress analysis for the newly generated surfaces can be used. However, this procedure is destructive, laborious and furthermore, it has to be checked whether corrections have to be applied due to stress relaxation. By using neutron radiation penetration depths generally up to several millimetres can be achieved non destructively [1]. However neutron measurements are critical at the surface. When scanning a sample surface, aberration peak shifts caused by so called spurious strains arise due to the fact that the gauge volume defined by the primary and secondary optics is partially outside of the sample. These aberration peak shifts can be of the same order of magnitude as the peak shifts related to residual strains [2-6]. In this exemplary study it will be demonstrated that, by optimising the bending radius of a Si (400) monochromator, the spurious surface strains can be strongly reduced when compared to the values obtained with a traditional Ge (311) mosaic monochromator, even when the gauge volume is mainly out of the surface. The objective of the experiments is to find the optimal monochromator settings for the Si (400) monochromator at the STRESS-SPEC instrument at the research reactor FRM II, Munich, Germany. For the parametric studies a stress free steel sample of the fine grained construction steel, S690QL was used. The optimised conditions for the Si (400) monochromator that resulted from the systematic studies were applied to a shot peened plate of steel SAE 4140. The residual stress distribution is analysed by means of through surface strain scanning. The residual stress gradient obtained is in very good agreement with the well characterised residual stress depth profile obtained within a round robin test in the scope of the BRITE-EURAM-project ENSPED (European Network of Surface and Prestress Engineering and Design) [7]. The results indicated that surface residual stress profiles can be measured with neutrons up to 200 µm underneath the surface without time consuming and laborious surface effect corrections.

Residual Stress Analysis with Neutrons

1989 ◽  
Vol 166 ◽  
Author(s):  
Aaron D. Krawitz
Keyword(s):  
Residual Stress ◽  
Residual Stresses ◽  
Stress Analysis ◽  
X Rays ◽  
X Ray Diffraction ◽  
Paper Briefly ◽  
Sampling Depth ◽  
X Ray ◽  
Stress Studies ◽  
Residual Stress Analysis

ABSTRACTThe use of neutrons for the measurement of stress is complementary to and extends traditional x-ray diffraction methods to new types of problems. This is due to the lower absorption of neutrons compared to x-rays by most engineering materials, which increases the sampling depth from microns to millimeters. It is particularly suitable for triaxial macrostress gradients through the depth of engineering components and volumetric microstresses in composites. In addition, applied stress studies may also be performed. This paper briefly describes the nature of residual stresses, the use of diffraction for stress measurements, experimental aspects of the use of neutrons, and illustrative applications.

Residual Stress Analysis in Both As-Deposited and Annealed CrN Coatings

2005 ◽  
Vol 490-491 ◽  
pp. 643-648 ◽  
Author(s):  
Ru Lin Peng ◽  
Yan Dong Wang ◽  
Magnus Odén ◽  
Jonathan Almer
Keyword(s):  
Residual Stress ◽  
Residual Stresses ◽  
Stress Analysis ◽  
Orientation Distribution ◽  
High Energy ◽  
Linear Distribution ◽  
Residual Stress Analysis ◽  
Steel Substrates ◽  
Thick Coatings ◽  
Crn Coatings

In this paper, we report on residual stress analysis in physical vapour deposited (PVD) CrN coatings. Two 9 µm thick coatings were grown on tool steel substrates with bias voltages of - 50 V and -300 V, respectively. High-energy (E=80 keV) synchrotron radiation measurements have been performed to investigate residual stresses in both as-deposited and annealed CrN coatings. To understand the origins of non-linear distribution of lattice strain versus sin2ψ for certain (hkl) planes in both coatings, a stress orientation distribution function (SODF) analysis has been carried out, which yields grain-orientation-dependent residual stresses. The results are compared to previous analyses using Reuss and Vook-Witt models on the as-deposited coatings.

Application of Synchrotron Radiation to Residual Stress Analysis by IP/cosα Method

2008 ◽  
Vol 571-572 ◽  
pp. 249-254 ◽  
Author(s):  
Toshihiko Sasaki ◽  
Yohei Miyazawa ◽  
Shunichi Takahashi ◽  
Ryohei Matsuyama ◽  
Katsunari Sasaki ◽  
...  
Keyword(s):  
Residual Stress ◽  
Synchrotron Radiation ◽  
Stress Analysis ◽  
Stress Measurement ◽  
High Energy ◽  
Ray Method ◽  
X Ray ◽  
High Energy Accelerator ◽  
Diffraction Angle ◽  
Residual Stress Analysis

The X-ray stress measurement with synchrotron radiation (SR) and an image plate (IP) was conducted using the facility of the Photon Factory (PF) of the High Energy Accelerator Research Organization (KEK). The influence of 2θ on stress measurement with the cosα method was investigated. The experiments were conducted under the conditions of 2θ=170 deg, 156.4 deg and 127 deg respectively. It was found that the hypothesis on the relation between the accuracy and the diffraction angle in the X-ray method is not valid in case of the cosα method.

Sign in / Sign up

Export Citation Format

Share Document