In-Situ Synchrotron X-ray Studies of Processing and Physics of Ferroelectric Thin Films

Polar Oxides ◽  
2005 ◽  
pp. 151-161
Author(s):  
G. B. Stephenson ◽  
S. K. Streiffer ◽  
D. D. Fong ◽  
M. V. Ramana Murty ◽  
O. Auciello ◽  
...  
Keyword(s):  
Thin Films ◽  
Ferroelectric Thin Films ◽  
X Ray

In situ x-ray diffraction of solution-derived ferroelectric thin films for quantitative phase and texture evolution measurement

2012 ◽  
Vol 112 (10) ◽  
pp. 104109 ◽  
Author(s):  
Krishna Nittala ◽  
Sungwook Mhin ◽  
Jacob L. Jones ◽  
Douglas S. Robinson ◽  
Jon F. Ihlefeld ◽  
...  
Keyword(s):  
Thin Films ◽  
Texture Evolution ◽  
Ferroelectric Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Quantitative Phase

In Situ X-Ray Reflectivity Study of Imprint in Ferroelectric Thin Films

2011 ◽  
Vol 687 ◽  
pp. 292-296 ◽  
Author(s):  
Jiang Li Cao ◽  
Kai Zhang ◽  
Axel Solbach ◽  
Zhen Xing Yue ◽  
Huang Hua Wang ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Parameters ◽  
Ferroelectric Thin Films ◽  
Interface Roughness ◽  
Related Phenomenon ◽  
X Ray ◽  
Interfacial Layers ◽  
Interface Roughening ◽  
Pzt Ferroelectric Thin Films

The structural origin of imprint in Pb(Zr,Ti)O3 (PZT) ferroelectric thin films derived by chemical solution deposition with Pt top and bottom electrodes was studied by in-situ high-resolution X-ray specular reflectivity of synchrotron radiation. Global structural parameters of density, thickness, and surface or interface roughness of each component layer in the thin film sample were obtained. No generation of interfacial layers with a different electron density from PZT and no interface roughening were observed at the interfaces of PZT and Pt during imprint. Thus, the results suggest that the imprint effect is more likely a bulk or electronic defects-related phenomenon.

In situ Hard X-ray Photoelectron Spectroscopy on the Origin of Irreversibility in Electrochromic LixWO3 Thin Films

2021 ◽  
pp. 150898
Author(s):  
Makoto Takayanagi ◽  
Takashi Tsuchiya ◽  
Shigenori Ueda ◽  
Tohru Higuchi ◽  
Kazuya Terabe
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
X Ray

Electric-field-induced lattice distortion in epitaxial BiFeO3 thin films as determined by in situ time-resolved x-ray diffraction

2017 ◽  
Vol 111 (8) ◽  
pp. 082907 ◽  
Author(s):  
Seiji Nakashima ◽  
Osami Sakata ◽  
Hiroshi Funakubo ◽  
Takao Shimizu ◽  
Daichi Ichinose ◽  
...  
Keyword(s):  
Thin Films ◽  
Electric Field ◽  
Lattice Distortion ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
Bifeo3 Thin Films

Kinetics of Ion-Exchange Reactions in Hybrid Organic–Inorganic Perovskite Thin Films Studied by In Situ Real-Time X-ray Scattering

2018 ◽  
Vol 9 (23) ◽  
pp. 6750-6754 ◽  
Author(s):  
Alessandro Greco ◽  
Alexander Hinderhofer ◽  
M. Ibrahim Dar ◽  
Neha Arora ◽  
Jan Hagenlocher ◽  
...  
Keyword(s):  
Thin Films ◽  
Ion Exchange ◽  
Real Time ◽  
Exchange Reactions ◽  
Inorganic Perovskite ◽  
X Ray ◽  
X Ray Scattering ◽  
Kinetics Of ◽  
Kinetics Of Ion Exchange

Thermal stability and miscibility of co-evaporated methyl ammonium lead halide (MAPbX3, X = I, Br, Cl) thin films analysed by in situ X-ray diffraction

2018 ◽  
Vol 6 (24) ◽  
pp. 11496-11506 ◽  
Author(s):  
Paul Pistor ◽  
Thomas Burwig ◽  
Carlo Brzuska ◽  
Björn Weber ◽  
Wolfgang Fränzel
Keyword(s):  
Thin Films ◽  
Thermal Stability ◽  
Thermal Treatment ◽  
Phase Evolution ◽  
X Ray Diffraction ◽  
Crystalline Phases ◽  
X Ray ◽  
Subsequent Thermal Treatment ◽  
Lead Halide

We present the identification of crystalline phases by in situ X-ray diffraction during growth and monitor the phase evolution during subsequent thermal treatment of CH3NH3PbX3 (X = I, Br, Cl) perovskite thin films.

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