Nanometer-Scale View of the Electrified Interface: Scanning Probe Microscopy Study

2005 ◽  
pp. 107-118
Author(s):  
Peter Müller ◽  
Laura Rossi ◽  
Santos F. Alvarado
Keyword(s):  
Scanning Probe Microscopy ◽  
Microscopy Study ◽  
Scanning Probe ◽  
Nanometer Scale ◽  
Probe Microscopy ◽  
Electrified Interface

Algorithms for Dynamic Hardness Measurements by Scratch Testing in the Submicron and Nanometer Scale

2013 ◽  
Vol 853 ◽  
pp. 619-624
Author(s):  
Natalia Lvova ◽  
K. Kravchuk ◽  
I. Shirokov
Keyword(s):  
Contact Area ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Nanometer Scale ◽  
Geometrical Parameters ◽  
Scratch Testing ◽  
Dynamic Hardness ◽  
Probe Microscopy ◽  
Parameters Analysis

The automatic scratch geometrical parameters analysis algorithms based on the images obtained by scanning probe microscopy have been developed. We provide a description of the technique to determine the contact area and the scratch volume with and without account of the pile-ups. The developed algorithms are applied to measure the dynamic hardness by sclerometry on the submicron and nanometer scale.

Conductive paths through polycrystalline BaTiO3: Scanning probe microscopy study

2016 ◽  
Vol 109 (7) ◽  
pp. 072904 ◽  
Author(s):  
Talin Ayvazian ◽  
Gennadi Bersuker ◽  
Zachary R. Lingley ◽  
Miles J. Brodie ◽  
Brendan J. Foran
Keyword(s):  
Scanning Probe Microscopy ◽  
Microscopy Study ◽  
Scanning Probe ◽  
Probe Microscopy

A Scanning Probe Microscopy Study of Cd1−x Zn x Te

2009 ◽  
Vol 38 (8) ◽  
pp. 1528-1532 ◽  
Author(s):  
C. K. Egan ◽  
P. Dabrowski ◽  
Z. Klusek ◽  
A. W. Brinkman
Keyword(s):  
Scanning Probe Microscopy ◽  
Microscopy Study ◽  
Scanning Probe ◽  
Probe Microscopy

scholarly journals Prospects of scanning probe microscopy for nanometer-scale lithography.

1995 ◽  
Vol 8 (4) ◽  
pp. 669-676 ◽  
Author(s):  
LARRY AKIO NAGAHARA ◽  
HIROTAKA OHNO ◽  
HIROSHI TOKUMOTO
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Nanometer Scale ◽  
Probe Microscopy
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