scholarly journals High Speed and Sensitive X-ray Analysis System with Automated Aberration Correction Scanning Transmission Electron Microscope

2015 ◽  
Vol 45 (1) ◽  
pp. 1-8 ◽  
Author(s):  
Hiromi Inada ◽  
Yoichi Hirayama ◽  
Keiji Tamura ◽  
Daisuke Terauchi ◽  
Ryoji Namekawa ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
High Speed ◽  
Scanning Transmission Electron Microscope ◽  
Aberration Correction ◽  
X Ray ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Analysis System
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