Core-hole Effect on Partial Electronic Density of State and O K-edge x-ray Raman Scattering Spectra of High-Pressure SiO2 Phases

2017 ◽  
Vol 30 (2) ◽  
pp. 59-70
Author(s):  
Hoon Khim ◽  
Yoo Soo Yi ◽  
Sung Keun Lee
Keyword(s):  
High Pressure ◽  
Raman Scattering ◽  
Density Of State ◽  
Core Hole ◽  
Electronic Density ◽  
X Ray ◽  
Scattering Spectra ◽  
Raman Scattering Spectra ◽  
Hole Effect

Saturation Behavior in X-ray Raman Scattering Spectra of Aqueous LiCl

2013 ◽  
Vol 117 (51) ◽  
pp. 16506-16511 ◽  
Author(s):  
Iina Juurinen ◽  
Tuomas Pylkkänen ◽  
Kari O. Ruotsalainen ◽  
Christoph J. Sahle ◽  
Giulio Monaco ◽  
...  
Keyword(s):  
Raman Scattering ◽  
X Ray ◽  
Scattering Spectra ◽  
Raman Scattering Spectra

Spectrometer for polarized soft X-ray Raman scattering

1998 ◽  
Vol 5 (3) ◽  
pp. 1013-1015 ◽  
Author(s):  
Y. Harada ◽  
H. Ishii ◽  
M. Fujisawa ◽  
Y. Tezuka ◽  
S. Shin ◽  
...  
Keyword(s):  
Raman Scattering ◽  
Energy Range ◽  
Incident Beam ◽  
Experimental System ◽  
Raman Scattering Spectroscopy ◽  
X Ray ◽  
Photon Factory ◽  
Scattering Spectra ◽  
Ray Trace ◽  
Raman Scattering Spectra

An experimental system for polarized soft X-ray Raman scattering spectroscopy has been constructed. The soft X-ray spectrometer is based on the Rowland circle geometry with a holographic spherical grating. Three types of gratings are used to cover the energy range from 18 eV to 1200 eV. According to a ray-trace simulation, the resolution is expected to be 200 meV at 700 eV by using a 10 µm slit width. The polarized and depolarized soft X-ray Raman scattering spectra can be measured by rotating the soft X-ray spectrometer around the axis of the incident beam. Preliminary measurements of polarized and depolarized spectra were accomplished at undulator beamline BL-2C of the Photon Factory.

STRUCTURE AND TRANSPORT PROPERTIES OF Pr1-xSr1+xCoO4

2008 ◽  
Vol 22 (32) ◽  
pp. 3195-3205 ◽  
Author(s):  
M. LI ◽  
S. L. HUANG ◽  
Z. M. LV ◽  
J. L. ZHANG ◽  
H. Y. WU ◽  
...  
Keyword(s):  
Raman Scattering ◽  
Low Frequency ◽  
X Ray Diffraction ◽  
Phonon Interaction ◽  
Band Shift ◽  
X Ray ◽  
Electron Phonon Interaction ◽  
Scattering Spectra ◽  
Raman Scattering Spectra ◽  
Dramatic Variation

Powder X-ray diffraction, Raman scattering and infrared spectra at different doping (x = 0 ~ 0.5) on polycrystalline Pr 1-x Sr 1+x CoO 4 were performed. With increasing x, the shift of Raman scattering spectra is due to the enhancement of electron–phonon interaction along the c-axis. The contrary variation of infrared in wavenumber comes from the weakening electron–phonon interactions in the ab plane. There is a dramatic variation in resistivity as x increases, which is also caused by increasing carrier concentration and is related to the band shift. For Pr 1-x Sr 1+x CoO 4, both A1g bands shift to low frequency and reach a minimum when x = 0.3 and the resistivity of Pr 0.7 Sr 1.3 CoO 4 is the smallest at room temperature.

scholarly journals First-principles modeling of x-ray Raman scattering spectra

2018 ◽  
Vol 98 (21) ◽  
Author(s):  
E. de Clermont Gallerande ◽  
D. Cabaret ◽  
G. Lelong ◽  
C. Brouder ◽  
M.-B. Attaiaa ◽  
...  
Keyword(s):  
Raman Scattering ◽  
First Principles ◽  
X Ray ◽  
Scattering Spectra ◽  
Raman Scattering Spectra

RESONANT Lα X-RAY RAMAN SCATTERING SPECTRA OF CeF3, CeO2andCeB6

2002 ◽  
Vol 09 (02) ◽  
pp. 1059-1064 ◽  
Author(s):  
S. NAKAI ◽  
T. WATANABE ◽  
K. SASAKI ◽  
T. IWASAKI ◽  
M. ODAKA ◽  
...  
Keyword(s):  
Absorption Spectrum ◽  
Raman Scattering ◽  
Shape Analysis ◽  
Line Shape ◽  
Emission Spectra ◽  
Edge Region ◽  
X Ray ◽  
Line Shape Analysis ◽  
Scattering Spectra ◽  
Raman Scattering Spectra

Resonant Lα emission spectra of Ce compounds, CeF 3, CeO 2 and CeB 6, were measured around the LIII absorption threshold. As the energy of the incident photon is tuned at the pre-edge region and at the absorption peaks of the Ce LIII absorption spectrum, the Raman peaks are resonantly enhanced. Obtained spectra are decomposed into Raman and normal Lα emission peaks by line shape analysis. The results show that the Raman spectra provide more detailed information than the absorption spectra about the 4f configuration of Ce compounds.

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