Handling Discontinuous Effects in Modeling Spatial Correlation of Wafer-level Analog/RF Tests
2018 ◽
Vol 26
(2)
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pp. 147-166
2002 ◽
Vol 7
(1)
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pp. 31-42
2012 ◽
Vol 132
(8)
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pp. 246-253
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2020 ◽
Vol 140
(7)
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pp. 165-169
Keyword(s):
2016 ◽
Vol 136
(10)
◽
pp. 437-442
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2017 ◽
Vol 137
(2)
◽
pp. 48-58
Keyword(s):
2016 ◽
Vol 136
(6)
◽
pp. 237-243
◽
2015 ◽
Vol E98.B
(3)
◽
pp. 449-455
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