The Secondary Electron Emission Photocathode Characteristics for Time Resolved X-Ray Spectroscopy

1978 ◽  
Vol 17 (S2) ◽  
pp. 477 ◽  
Author(s):  
Burton L. Henke ◽  
Kandatege Premaratne
Keyword(s):  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
Time Resolved ◽  
X Ray

X-ray-induced secondary-electron emission from solid xenon

1989 ◽  
Vol 39 (1) ◽  
pp. 1-9 ◽  
Author(s):  
E. M. Gullikson ◽  
B. L. Henke
Keyword(s):  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
X Ray

Characterization of Tungsten Surfaces by Simultaneous Work Function and Secondary Electron Emission Measurements

2003 ◽  
Vol 9 (4) ◽  
pp. 337-342 ◽  
Author(s):  
Gy. Vida ◽  
V.K. Josepovits ◽  
M. Győr ◽  
P. Deák
Keyword(s):  
Work Function ◽  
Electron Emission ◽  
Photoelectron Spectroscopy ◽  
Secondary Electron ◽  
Direct Relationship ◽  
Secondary Electron Emission ◽  
Ion Sputtering ◽  
X Ray ◽  
Simultaneous Change

The changes of the work function (Φ) and the secondary electron emission (SEE) of oxygen covered polycrystalline tungsten occurring after ion sputtering and heat treatments have been investigated. The chemical composition was analyzed by X-ray photoelectron spectroscopy (XPS), and the electron emission properties by work function spectroscopy (WFS). We observed in what manner the chemical changes of the surface are reflected in the work function and SEE. The simultaneous change of Φ and SEE in the case of oxygen covered tungsten have been pointed out and a direct relationship between them can be supposed.

Semiempirical method for calculation of secondary electron emission coefficients of insulating materials using their spectra of x-ray photoelectron spectroscopy

2007 ◽  
Vol 22 (11) ◽  
pp. 3178-3185 ◽  
Author(s):  
Tae Wook Heo ◽  
Sung Hwan Moon ◽  
Sun Young Park ◽  
Jae Hyuk Kim ◽  
Hyeong Joon Kim
Keyword(s):  
Electron Emission ◽  
Photoelectron Spectroscopy ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
Protective Layer ◽  
Semiempirical Method ◽  
Xps Spectra ◽  
Insulating Materials ◽  
X Ray ◽  
Plasma Display

The importance of the secondary electron emission of the protective layer in the alternating current plasma display panels is widely known. However, the difficulty in measuring the secondary electron emission coefficients (γ) of insulating materials has hampered efforts to obtain accurate estimates of their values. To overcome the difficulty of direct measurement, we devised a calculating γ using the spectra of x-ray photoelectron spectroscopy (XPS) and a well-defined theory. The XPS spectra of the valence and core bands of MgO, Al2O3, and Y2O3 films, which were deposited by e-beam evaporation, were measured. Calculations of the γ values were conducted for the case when gas ions such as He, Ne, Ar, and Xe slowly approach the solid surface.

scholarly journals Influences of Thermal Annealing and X-ray Irradiation on Secondary Electron Emission and Cathodoluminescence Spectra of Alumina Materials.

Shinku ◽  
1999 ◽  
Vol 42 (9) ◽  
pp. 834-839 ◽  
Author(s):  
Takayuki SATO ◽  
Shinichiro MICHIZONO ◽  
Yoshio SAITO ◽  
Shinichi KOBAYASHI
Keyword(s):  
Thermal Annealing ◽  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
X Ray
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