Polarized photoluminescence imaging analysis around small-angle grain boundaries in multicrystalline silicon wafers for solar cells

2014 ◽  
Vol 53 (8) ◽  
pp. 080303 ◽  
Author(s):  
Gen Kato ◽  
Michio Tajima ◽  
Hiroyuki Toyota ◽  
Atsushi Ogura
Keyword(s):  
Solar Cells ◽  
Grain Boundaries ◽  
Small Angle ◽  
Silicon Wafers ◽  
Multicrystalline Silicon ◽  
Imaging Analysis

Interaction between Metal Impurities and Small-Angle Grain Boundaries on Recombination Properties in Multicrystalline Silicon for Solar Cells

2012 ◽  
Vol 5 (4) ◽  
pp. 042301 ◽  
Author(s):  
Takashi Sameshima ◽  
Naoto Miyazaki ◽  
Yuki Tsuchiya ◽  
Hiroki Hashiguchi ◽  
Tomihisa Tachibana ◽  
...  
Keyword(s):  
Solar Cells ◽  
Grain Boundaries ◽  
Small Angle ◽  
Multicrystalline Silicon ◽  
Metal Impurities

scholarly journals Photoluminescence Analysis of Oxygen Precipitation around Small-Angle Grain Boundaries in Multicrystalline Silicon Wafers

2014 ◽  
Vol 125 (4) ◽  
pp. 1010-1012 ◽  
Author(s):  
G. Kato ◽  
M. Tajima ◽  
F. Okayama ◽  
S. Tokumaru ◽  
R. Sato ◽  
...  
Keyword(s):  
Grain Boundaries ◽  
Small Angle ◽  
Silicon Wafers ◽  
Multicrystalline Silicon ◽  
Oxygen Precipitation

Impacts of Metal Impurities on Recombination Properties at Small Angle Grain Boundaries in Multicrystalline Silicon for Solar Cells

2019 ◽  
Vol 41 (4) ◽  
pp. 29-36 ◽  
Author(s):  
Takashi Sameshima ◽  
Yuki Tsuchiya ◽  
Naoto Miyazaki ◽  
Tomihisa Tachibana ◽  
Yoshio Ohshita ◽  
...  
Keyword(s):  
Solar Cells ◽  
Grain Boundaries ◽  
Small Angle ◽  
Multicrystalline Silicon ◽  
Metal Impurities

Impurities in multicrystalline silicon wafers for solar cells detected by synchrotron micro-beam X-ray fluorescence analysis

2012 ◽  
Vol 27 (11) ◽  
pp. 1875 ◽  
Author(s):  
Günter Buzanich ◽  
Martin Radtke ◽  
Uwe Reinholz ◽  
Heinrich Riesemeier ◽  
Andreas F. Thünemann ◽  
...  
Keyword(s):  
Solar Cells ◽  
Fluorescence Analysis ◽  
Silicon Wafers ◽  
Multicrystalline Silicon ◽  
X Ray
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