Quantum Compact Model of Drain Current in Independent Double-Gate Metal–Oxide–Semiconductor Field-Effect Transistors

2011 ◽  
Vol 50 (2R) ◽  
pp. 024301 ◽  
Author(s):  
Daniela Munteanu ◽  
Jean-Luc Autran ◽  
Mathieu Moreau
2006 ◽  
Vol 45 (4B) ◽  
pp. 3088-3096 ◽  
Author(s):  
Marlène Ferrier ◽  
Raphael Clerc ◽  
Georges Pananakakis ◽  
Gerard Ghibaudo ◽  
Frederic Boeuf ◽  
...  

2002 ◽  
Vol 743 ◽  
Author(s):  
Z. Y. Fan ◽  
J. Li ◽  
J. Y. Lin ◽  
H. X. Jiang ◽  
Y. Liu ◽  
...  

ABSTRACTThe fabrication and characterization of AlGaN/GaN metal-oxide-semiconductor heterostructure field-effect transistors (MOSHFETs) with the δ-doped barrier are reported. The incorporation of the SiO2 insulated-gate and the δ-doped barrier into HFET structures reduces the gate leakage and improves the 2D channel carrier mobility. The device has a high drain-current-driving and gate-control capabilities as well as a very high gate-drain breakdown voltage of 200 V, a cutoff frequency of 15 GHz and a maximum frequency of oscillation of 34 GHz for a gate length of 1 μm. These characteristics indicate a great potential of this structure for high-power-microwave applications.


Sign in / Sign up

Export Citation Format

Share Document