Coherent Manipulation of Nuclear Spins in Semiconductors with an Electric Field

2013 ◽  
Vol 6 (3) ◽  
pp. 033002 ◽  
Author(s):  
Masaaki Ono ◽  
Jun Ishihara ◽  
Genki Sato ◽  
Yuzo Ohno ◽  
Hideo Ohno
Keyword(s):  
Electric Field ◽  
Nuclear Spins ◽  
Coherent Manipulation

scholarly journals Coherent manipulation of nuclear spins using spin injection from a half-metallic spin source

2015 ◽  
Vol 91 (14) ◽  
Author(s):  
Tetsuya Uemura ◽  
Takafumi Akiho ◽  
Yuya Ebina ◽  
Masafumi Yamamoto
Keyword(s):  
Spin Injection ◽  
Nuclear Spins ◽  
Half Metallic ◽  
Coherent Manipulation

Molecular Rovibronic Symmetries in Electric and Magnetic Fields

1975 ◽  
Vol 53 (19) ◽  
pp. 2210-2220 ◽  
Author(s):  
James K. G. Watson
Keyword(s):  
Magnetic Field ◽  
Magnetic Fields ◽  
Electric Field ◽  
Symmetry Groups ◽  
Nuclear Spins ◽  
Symmetry Classification ◽  
Electric And Magnetic Fields ◽  
Field Symmetry ◽  
Point Groups

The structures of the symmetry groups for the rovibronic levels of a molecule in a homogeneous electric or magnetic field are derived, and the symmetry classification of the levels in terms of the representations and corepresentations of these groups is discussed. Specific results are given for molecules of the point groups C3, C2v, C3v, D2d, and Td in an electric field. Symmetry in combined electric and magnetic fields and the inclusion of nuclear spins are considered briefly.

scholarly journals Coherent manipulation of nuclear spins using spin injection from a half-metallic spin source

2016 ◽  
Author(s):  
Tetsuya Uemura ◽  
Takafumi Akiho ◽  
Yuya Ebina ◽  
Masafumi Yamamoto
Keyword(s):  
Spin Injection ◽  
Nuclear Spins ◽  
Half Metallic ◽  
Coherent Manipulation

scholarly journals Coherent manipulation of nuclear spins in the breakdown regime of integer quantum Hall states

2009 ◽  
Vol 150 (2) ◽  
pp. 022034 ◽  
Author(s):  
M Kawamura ◽  
H Takahashi ◽  
Y Hashimoto ◽  
S Katsumoto ◽  
T Machida
Keyword(s):  
Quantum Hall ◽  
Nuclear Spins ◽  
Quantum Hall States ◽  
Integer Quantum ◽  
Coherent Manipulation ◽  
Hall States

Resolution in photoelectron microscopy

1991 ◽  
Vol 49 ◽  
pp. 458-459
Author(s):  
G. F. Rempfer
Keyword(s):  
Electron Microscopy ◽  
Electric Field ◽  
Ultraviolet Light ◽  
Uniform Field ◽  
Virtual Image ◽  
Lens System ◽  
Photoemission Electron Microscopy ◽  
Planar Electrode ◽  
Electron Lens ◽  
Photoemission Electron

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.

Field-assisted ionization theory for microscopists

1994 ◽  
Vol 52 ◽  
pp. 820-821
Author(s):  
Patrick P. Camus
Keyword(s):  
Electric Field ◽  
Electron Tunneling ◽  
Ionization Probability ◽  
Critical Distance ◽  
Tunneling Probability ◽  
Field Ionization ◽  
Radius Of Curvature ◽  
Field Evaporation ◽  
A Value ◽  
Ion Emission

The theory of field ion emission is the study of electron tunneling probability enhanced by the application of a high electric field. At subnanometer distances and kilovolt potentials, the probability of tunneling of electrons increases markedly. Field ionization of gas atoms produce atomic resolution images of the surface of the specimen, while field evaporation of surface atoms sections the specimen. Details of emission theory may be found in monographs.Field ionization (FI) is the phenomena whereby an electric field assists in the ionization of gas atoms via tunneling. The tunneling probability is a maximum at a critical distance above the surface,xc, Fig. 1. Energy is required to ionize the gas atom at xc, I, but at a value reduced by the appliedelectric field, xcFe, while energy is recovered by placing the electron in the specimen, φ. The highest ionization probability occurs for those regions on the specimen that have the highest local electric field. Those atoms which protrude from the average surfacehave the smallest radius of curvature, the highest field and therefore produce the highest ionizationprobability and brightest spots on the imaging screen, Fig. 2. This technique is called field ion microscopy (FIM).

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