scholarly journals Study on far-field diffraction pattern of cube corner retroreflector at oblique incidence

2021 ◽  
Vol 0 (0) ◽  
pp. 0-0
Author(s):  
◽  
◽  
Keyword(s):  
Diffraction Pattern ◽  
Oblique Incidence ◽  
Far Field ◽  
Cube Corner ◽  
Cube Corner Retroreflector

Far-field diffraction pattern of a nonideal retroreflector for polarized light with an oblique incidence

2020 ◽  
Vol 59 (8) ◽  
pp. 2621
Author(s):  
Zhou Hui ◽  
Li Song ◽  
Zhang Wenhao ◽  
Chen Yuwei
Keyword(s):  
Diffraction Pattern ◽  
Oblique Incidence ◽  
Polarized Light ◽  
Far Field

Research on far-field diffraction of cube-corner retroreflector in the satellite laser ranging system

2010 ◽  
Author(s):  
Yin-kan Weng ◽  
Song Li ◽  
Hui Zhou ◽  
Jin-ling Yang ◽  
Guo-xing Zheng ◽  
...  
Keyword(s):  
Satellite Laser Ranging ◽  
Laser Ranging ◽  
Far Field ◽  
Cube Corner ◽  
Cube Corner Retroreflector

Far-field diffraction pattern of a Bessel-Gauss beam through a pentagonal aperture

2014 ◽  
Author(s):  
Cristian H. Acevedo ◽  
Carlos F. Meza ◽  
Yezid T. Moreno ◽  
Ángela M. Guzmán
Keyword(s):  
Diffraction Pattern ◽  
Far Field ◽  
Gauss Beam

Far-field Diffraction Pattern of Two Opaque Rectangles Located in Parallel Planes

1993 ◽  
Vol 40 (10) ◽  
pp. 1973-1980
Author(s):  
P.R. Hobson ◽  
G.J. Rodgers
Keyword(s):  
Diffraction Pattern ◽  
Far Field

Detecting the topological charge of a vortex beam by an arc slit diffraction

2017 ◽  
Vol 31 (23) ◽  
pp. 1750172 ◽  
Author(s):  
Dongzhi Fu ◽  
Hailong Zhou ◽  
Kaiwei Wang ◽  
Pei Zhang ◽  
Jianji Dong ◽  
...  
Keyword(s):  
Angular Momentum ◽  
Diffraction Pattern ◽  
Orbital Angular Momentum ◽  
Topological Charge ◽  
Light Spot ◽  
Far Field ◽  
Vortex Beam ◽  
Efficient Measurement ◽  
Vortex Beams

The simple and efficient measurement of the light orbital angular momentum (OAM) is essential to both the classical and quantum applications with vortex beams. Here, we study the diffraction pattern in the far field when a vortex beam passes through an arc slit and demonstrate experimentally that a light spot of the diffraction pattern has a displacement which is linear to the topological charge (TC) of the incident vortex beam. Based on this property, this method is capable of measuring both modulus and sign of TC of the vortex beam. Furthermore, this scheme allows identifying multiple OAM states simultaneously.

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