Detection of intensity peaks in high-resolution transmission electron microscopy image based on YOLOv3 network*

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doi:10.7498/aps.70.20201502

Detection of intensity peaks in high-resolution transmission electron microscopy image based on YOLOv3 network*

Acta Physica Sinica ◽

10.7498/aps.70.20201502 ◽

2021 ◽

Vol 0 (0) ◽

pp. 0-0

Author(s):

◽

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Transmission Electron Microscopy Image ◽

Electron Microscopy Image ◽

Transmission Electron ◽

Microscopy Image

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A comparison of soot nanostructure obtained using two high resolution transmission electron microscopy image analysis algorithms

Carbon ◽

10.1016/j.carbon.2011.06.003 ◽

2011 ◽

Vol 49 (13) ◽

pp. 4256-4268 ◽

Cited By ~ 71

Author(s):

Kuen Yehliu ◽

Randy L. Vander Wal ◽

André L. Boehman

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Image Analysis ◽

High Resolution ◽

Transmission Electron Microscopy Image ◽

Electron Microscopy Image ◽

Transmission Electron ◽

Microscopy Image ◽

Microscopy Image Analysis

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Piezoelectric field around threading dislocation in GaN determined on the basis of high-resolution transmission electron microscopy image

Journal of Microscopy ◽

10.1111/j.1365-2818.2006.01622.x ◽

2006 ◽

Vol 223 (3) ◽

pp. 212-215 ◽

Cited By ~ 4

Author(s):

G. MACIEJEWSKI ◽

S. KRET ◽

P. RUTERANA

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Transmission Electron Microscopy Image ◽

Threading Dislocation ◽

Electron Microscopy Image ◽

Transmission Electron ◽

Microscopy Image ◽

Piezoelectric Field

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HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY IMAGE ANALYSIS OF DISORDERED CARBONS USED FOR ELECTROCHEMICAL STORAGE OF ENERGY

New Carbon Based Materials for Electrochemical Energy Storage Systems: Batteries, Supercapacitors and Fuel Cells - NATO Science Series II: Mathematics, Physics and Chemistry ◽

10.1007/1-4020-4812-2_32 ◽

2006 ◽

pp. 411-424 ◽

Cited By ~ 1

Author(s):

Jean-Noël Rouzaud ◽

Christian Clinard ◽

Frédéric Chevallier ◽

Alexandre Thery ◽

François Béguin

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Image Analysis ◽

High Resolution ◽

Transmission Electron Microscopy Image ◽

Electron Microscopy Image ◽

Transmission Electron ◽

Microscopy Image ◽

Electrochemical Storage ◽

Microscopy Image Analysis

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Inclusion of radiation damage dynamics in high-resolution transmission electron microscopy image simulations: The example of graphene

Physical Review B ◽

10.1103/physrevb.87.094110 ◽

2013 ◽

Vol 87 (9) ◽

Cited By ~ 24

Author(s):

Adriano Santana ◽

Alberto Zobelli ◽

Jani Kotakoski ◽

Andrey Chuvilin ◽

Elena Bichoutskaia

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Radiation Damage ◽

Transmission Electron Microscopy Image ◽

Electron Microscopy Image ◽

Transmission Electron ◽

Microscopy Image ◽

Damage Dynamics ◽

Image Simulations

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Circular Fast Fourier Transform Application: A Useful Script for Fast Fourier Transform Data Analysis of High-resolution Transmission Electron Microscopy Image

Applied Microscopy ◽

10.9729/am.2014.44.4.138 ◽

2014 ◽

Vol 44 (4) ◽

pp. 138-143

Author(s):

Jin-Gyu Kim ◽

Seung Jo Yoo ◽

Chang-Yeon Kim ◽

Hyeong-Tae Jou

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Fourier Transform ◽

Data Analysis ◽

High Resolution ◽

Fast Fourier Transform ◽

Transmission Electron Microscopy Image ◽

Electron Microscopy Image ◽

Transmission Electron ◽

Microscopy Image

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Exit-wave phase retrieval from a single high-resolution transmission electron microscopy image of a weak-phase object

Micron ◽

10.1016/j.micron.2018.07.001 ◽

2018 ◽

Vol 114 ◽

pp. 23-31 ◽

Cited By ~ 2

Author(s):

F. Lin ◽

X.B. Ren ◽

W.P. Zhou ◽

L.Y. Zhang ◽

Y. Xiao ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Phase Retrieval ◽

Transmission Electron Microscopy Image ◽

Phase Object ◽

Electron Microscopy Image ◽

Weak Phase ◽

Transmission Electron ◽

Microscopy Image

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Identification of interdendritic phases in Ni 30Cr weld metal with additions of tantalum and molybdenum using electron diffraction pattern and high-resolution scanning transmission electron microscopy image analysis

Materials Characterization ◽

10.1016/j.matchar.2020.110460 ◽

2020 ◽

Vol 167 ◽

pp. 110460

Author(s):

Cheng-Han Li ◽

Carolin Fink ◽

John C. Lippold ◽

Joerg R. Jinschek

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Image Analysis ◽

High Resolution ◽

Scanning Transmission Electron Microscopy ◽

Transmission Electron Microscopy Image ◽

Transmission Electron ◽

Microscopy Image ◽

Scanning Transmission ◽

Microscopy Image Analysis

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Automated Detection of Synapses in Serial Section Transmission Electron Microscopy Image Stacks

PLoS ONE ◽

10.1371/journal.pone.0087351 ◽

2014 ◽

Vol 9 (2) ◽

pp. e87351 ◽

Cited By ~ 38

Author(s):

Anna Kreshuk ◽

Ullrich Koethe ◽

Elizabeth Pax ◽

Davi D. Bock ◽

Fred A. Hamprecht

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Serial Section ◽

Transmission Electron Microscopy Image ◽

Automated Detection ◽

Electron Microscopy Image ◽

Transmission Electron ◽

Microscopy Image

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Calculation and Analysis of Multifractal Spectrum of Sinter Surface

Advanced Materials Research ◽

10.4028/www.scientific.net/amr.750-752.2267 ◽

2013 ◽

Vol 750-752 ◽

pp. 2267-2270

Author(s):

Zhi Min Cui ◽

Rong Li Sang ◽

Yuan Liang Li ◽

Qing Jun Zhang

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Pore Structure ◽

Multifractal Spectrum ◽

Transmission Electron Microscopy Image ◽

Structure Change ◽

Electron Microscopy Image ◽

Transmission Electron ◽

Microscopy Image ◽

Fractal Spectrum

Multifractal spectrums of sinter with different alkalinity were analyzed by multifractal software. The results show that sinter pore structure change from uniform to non-uniform with the improvement of alkalinity, Δα increases from 0.53 to 0.55. The structure of sinter pore is mainly microscopic by competition between macropores and micropores, Δf changes from 0.14 to-0.44. The distribution of sinter pores is quantitatively characterized by multi-fractal spectrum, which is consistent with transmission electron microscopy image.

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Nanoscale structure and texture of highly anisotropic pyrocarbons revisited with transmission electron microscopy, image processing, neutron diffraction and atomistic modeling

Carbon ◽

10.1016/j.carbon.2014.08.087 ◽

2014 ◽

Vol 80 ◽

pp. 472-489 ◽

Cited By ~ 35

Author(s):

B. Farbos ◽

P. Weisbecker ◽

H.E. Fischer ◽

J.-P. Da Costa ◽

M. Lalanne ◽

...

Keyword(s):

Electron Microscopy ◽

Image Processing ◽

Transmission Electron Microscopy ◽

Neutron Diffraction ◽

Transmission Electron Microscopy Image ◽

Atomistic Modeling ◽

Electron Microscopy Image ◽

Transmission Electron ◽

Microscopy Image ◽

Nanoscale Structure

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