Angle measurement uncertainty statistical distribution of pulsed laser quadrant photodetector

Zhang Wei;  Zhang He;  Chen Yong;  Zhang Xiang-Jin;  Xu Xiao-Bin

doi:10.7498/aps.66.012901

Origin of Difference in Photocatalytic Activity of ZnO (002) Grown on a- and c-Face Sapphire

International Journal of Photoenergy ◽

10.1155/2014/135725 ◽

2014 ◽

Vol 2014 ◽

pp. 1-5 ◽

Cited By ~ 1

Author(s):

Guoqiang Li ◽

Bingyang Sun ◽

Yali Wang ◽

Zhou Wu ◽

Weifeng Zhang

Keyword(s):

Photocatalytic Activity ◽

Pulsed Laser ◽

Contact Angle Measurement ◽

Angle Measurement ◽

Laser Deposition ◽

Surface Conductance ◽

Zno Films ◽

X Ray Diffraction ◽

Zno Film ◽

X Ray

The oriented (002) ZnO films were grown on a- and c-face sapphire by pulsed laser deposition. The X-ray diffraction analysis revealed that the oriented (002) ZnO films were epitaxially grown on the substrate successfully. The sample on a-face sapphire had higher crystal quality. However, the photocatalytic activity for Rhodamine B degradation of ZnO film on c-face sapphire was higher than that on a-face sapphire. The Raman spectrum and XPS analysis suggested that the sample on a-face sapphire had higher concentration of defects. The result of the contact angle measurement revealed that the sample on c-face sapphire had higher surface energy. And the investigation of the surface conductance implied that the higher light conductance was helpful for the photocatalytic activity.

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Analysis of angle measurement uncertainty for wMPS

10.1117/12.885389 ◽

2010 ◽

Cited By ~ 1

Author(s):

Lei Geng ◽

Jigui Zhu ◽

Xueyou Yang ◽

Zhi Xiong

Keyword(s):

Measurement Uncertainty ◽

Angle Measurement

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Angle measurement accuracy of quadrant photodetector with non-ideal signals

Optik ◽

10.1016/j.ijleo.2018.12.068 ◽

2019 ◽

Vol 181 ◽

pp. 869-879

Author(s):

Yong Chen ◽

Wei Zhang ◽

Shuaishuai Zhai

Keyword(s):

Measurement Accuracy ◽

Angle Measurement ◽

Quadrant Photodetector

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Evaluation on Angle Measurement Uncertainty of Fiber Optic Gyroscope Based on Monte Carlo Method

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.2021.3080390 ◽

2021 ◽

pp. 1-1

Author(s):

Jiapeng Mou ◽

Jingjing Su ◽

Lijun Miao ◽

Tengchao Huang

Keyword(s):

Monte Carlo ◽

Monte Carlo Method ◽

Measurement Uncertainty ◽

Fiber Optic ◽

Angle Measurement ◽

Fiber Optic Gyroscope

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Observations on the growth of YBa2Cu3O7-δ thin films on MgO by pulsed-laser ablation

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100089652 ◽

1991 ◽

Vol 49 ◽

pp. 1068-1069

Author(s):

M. Grant Norton ◽

C. Barry Carter

Keyword(s):

Thin Film ◽

Thin Films ◽

Laser Ablation ◽

Substrate Surface ◽

Pulsed Laser ◽

Pulsed Laser Ablation ◽

Thin Film Deposition ◽

Film Deposition ◽

Laser Ablation Process ◽

Deposition Parameters

Pulsed-laser ablation has been widely used to produce high-quality thin films of YBa2Cu3O7-δ on a range of substrate materials. The nonequilibrium nature of the process allows congruent deposition of oxides with complex stoichiometrics. In the high power density regime produced by the UV excimer lasers the ablated species includes a mixture of neutral atoms, molecules and ions. All these species play an important role in thin-film deposition. However, changes in the deposition parameters have been shown to affect the microstructure of thin YBa2Cu3O7-δ films. The formation of metastable configurations is possible because at the low substrate temperatures used, only shortrange rearrangement on the substrate surface can occur. The parameters associated directly with the laser ablation process, those determining the nature of the process, e g. thermal or nonthermal volatilization, have been classified as ‘primary parameters'. Other parameters may also affect the microstructure of the thin film. In this paper, the effects of these ‘secondary parameters' on the microstructure of YBa2Cu3O7-δ films will be discussed. Examples of 'secondary parameters' include the substrate temperature and the oxygen partial pressure during deposition.

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Microanalysis of silicate glass films grown on α-Al2O3 by pulsed-laser deposition

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100148022 ◽

1993 ◽

Vol 51 ◽

pp. 438-439

Author(s):

Michael P. Mallamaci ◽

James Bentley ◽

C. Barry Carter

Keyword(s):

Liquid Phase ◽

Single Crystal ◽

Pulsed Laser Deposition ◽

Pulsed Laser ◽

Ceramic Materials ◽

Laser Deposition ◽

Triple Junctions ◽

Ion Milling ◽

Multicomponent Oxides ◽

Glass Films

Glass-oxide interfaces play important roles in developing the properties of liquid-phase sintered ceramics and glass-ceramic materials. Deposition of glasses in thin-film form on oxide substrates is a potential way to determine the properties of such interfaces directly. Pulsed-laser deposition (PLD) has been successful in growing stoichiometric thin films of multicomponent oxides. Since traditional glasses are multicomponent oxides, there is the potential for PLD to provide a unique method for growing amorphous coatings on ceramics with precise control of the glass composition. Deposition of an anorthite-based (CaAl2Si2O8) glass on single-crystal α-Al2O3 was chosen as a model system to explore the feasibility of PLD for growing glass layers, since anorthite-based glass films are commonly found in the grain boundaries and triple junctions of liquid-phase sintered α-Al2O3 ceramics.Single-crystal (0001) α-Al2O3 substrates in pre-thinned form were used for film depositions. Prethinned substrates were prepared by polishing the side intended for deposition, then dimpling and polishing the opposite side, and finally ion-milling to perforation.

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TEM sample preparation of wear-tested room-temperature pulsed-laser-deposited thin films of MoS2 by ultramicrotomy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100151428 ◽

1993 ◽

Vol 51 ◽

pp. 1118-1119

Author(s):

Pamela F. Lloyd ◽

Scott D. Walck

Keyword(s):

Thin Films ◽

Sample Preparation ◽

Room Temperature ◽

High Vacuum ◽

Pulsed Laser ◽

Ultra High Vacuum ◽

Wear Testing ◽

Preparation Technique ◽

Cross Sectional ◽

Aerospace Applications

Pulsed laser deposition (PLD) is a novel technique for the deposition of tribological thin films. MoS2 is the archetypical solid lubricant material for aerospace applications. It provides a low coefficient of friction from cryogenic temperatures to about 350°C and can be used in ultra high vacuum environments. The TEM is ideally suited for studying the microstructural and tribo-chemical changes that occur during wear. The normal cross sectional TEM sample preparation method does not work well because the material’s lubricity causes the sandwich to separate. Walck et al. deposited MoS2 through a mesh mask which gave suitable results for as-deposited films, but the discontinuous nature of the film is unsuitable for wear-testing. To investigate wear-tested, room temperature (RT) PLD MoS2 films, the sample preparation technique of Heuer and Howitt was adapted.Two 300 run thick films were deposited on single crystal NaCl substrates. One was wear-tested on a ball-on-disk tribometer using a 30 gm load at 150 rpm for one minute, and subsequently coated with a heavy layer of evaporated gold.

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