scholarly journals Quantitative research into the influence of slider-disk contact force on the information intensity of the magnetic recording layer

2015 ◽  
Vol 64 (23) ◽  
pp. 237502
Author(s):  
Liu Yu-Liang ◽  
Chen Zhi-Gang ◽  
Sun Da-Xing ◽  
Zhang Guang-Yu
Keyword(s):  
Contact Force ◽  
Magnetic Recording ◽  
Quantitative Research ◽  
Recording Layer ◽  
Disk Contact ◽  
Information Intensity

scholarly journals On the Development of Photosensitive Materials with Magnetic Recording Layer

1961 ◽  
Vol 29 (1) ◽  
pp. E61-E65
Author(s):  
Mamoru NAMIKAWA ◽  
Minoru SATO ◽  
Yasuo IMAOKA
Keyword(s):  
Magnetic Recording ◽  
Recording Layer

Dynamics of head-disk contact/impact in magnetic recording

1987 ◽  
Vol 23 (5) ◽  
pp. 3435-3437 ◽  
Author(s):  
V. Ponnaganti ◽  
T. Kane ◽  
J. White
Keyword(s):  
Magnetic Recording ◽  
Disk Contact ◽  
Contact Impact

scholarly journals A study of perpendicular magnetic recording media using polarized SANS

2014 ◽  
Vol 70 (a1) ◽  
pp. C148-C148
Author(s):  
Stephen Lister ◽  
Vikash Venkataramana ◽  
Thomas Thomson ◽  
Joachim Kohlbrecher ◽  
Ken Takano ◽  
...  
Keyword(s):  
Thin Film ◽  
Data Storage ◽  
Magnetic Recording ◽  
Magnetic Moments ◽  
Magnetic Films ◽  
Oxide Shell ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
Recording Layer ◽  
Perpendicular Magnetic Recording

The study of thin film magnetic systems that are structured on the nanoscale is an area of intense interest. Small-angle neutron scattering is an extremely powerful probe of nanomagnetism in the bulk, but in thin-film systems the experiments are challenging due both to the small scattering volume available and also to scattering from other sources such as the substrate and sample environment. We have demonstrated that such experiments are however possible in magnetic films as thin as 10 nm. A good example to illustrate this is the case of perpendicular magnetic recording media. These materials are found in all modern magnetic hard drives, the data storage technology that continues to be of tremendous commercial and technological importance. These media are advanced functional multilayered materials, containing an active recording layer of only around 10 nm in thickness. This recording layer is compositionally segregated into 8 nm-sized grains of a magnetic CoCrPt alloy separated by a thin oxide shell, typically SiO2. These media have their magnetic moments oriented perpendicular to the plane of the film. Determining the local magnetic structure and reversal behavior is key to understanding the performance of perpendicular media in recording devices. Polarised SANS has proved to be a very effective tool to measure these materials at a sub-10nm length scales. The signal of interest must however also be distinguished from the scattering from other layers in the structure, some of which are also magnetic. We will present a summary of some recent results on recording media, including measurements of the grain-sized dependent switching with and without the presence of an exchange spring. We will also briefly mention experiments that demonstrate the viability of extending this approach to measurement for lithographically defined structures similar to those for application in bit-patterned media, including 2d artificial spin-ice and structurally glassy arrays.

Experimental and FEA Scratch Correlation of Magnetic Signal Degradation in Magnetic Storage Thin-Film Disks

2009 ◽  
Author(s):  
Raja R. Katta ◽  
Andreas A. Polycarpou ◽  
Sung-Chang Lee ◽  
Mike Suk
Keyword(s):  
Thin Film ◽  
Magnetic Recording ◽  
Permanent Deformation ◽  
Disk Drive ◽  
Magnetic Storage ◽  
Magnetic Signal ◽  
Element Analysis ◽  
Recording Layer ◽  
Signal Degradation ◽  
Extent Of Damage

Scratch-related magnetic signal degradation can occur during magnetic storage hard disk drive operation when the read-write heads contact the spinning multilayer disks. To investigate this phenomenon controlled nanoscratch experiments were performed on perpendicular magnetic recording media using various indenters of different radii of curvature. Various loading conditions were used to cause permanent scratches that were measured using atomic force microscopy. The nanoscratch experiments were simulated using finite element analysis (FEA) that included the detailed nanometer scale thin-film multilayer mechanical properties. The permanently deformed field in the sub-surface magnetic recording layer was extracted from the FEA results. The residual scratch widths measured on the surface of the magnetic storage disk were directly compared with the residual sub-surface widths of the region on the magnetic recording layer where extensive permanent lateral deformation was present. It was found that the sub-surface widths of the deformed regions were significantly larger than the surface scratch widths. Thus, sub-surface thin-film layers, such as the magnetic recording layer could be damaged without observable damage to the protective top surface carbon overcoat. The exact location and extent of damage to the magnetic recording layer depends on the scratch load, size of scratch tip, and the friction at the interface. Such permanent deformation in magnetic recording layer could lead to demagnetization, which has been reported in the literature.

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