scholarly journals Effect of thermomigration on the growth kinetics of Cu6Sn5 at liquid-solid interfaces in Cu/Sn/Cu solder joints

2015 ◽  
Vol 64 (16) ◽  
pp. 166601
Author(s):  
Zhao Ning ◽  
Zhong Yi ◽  
Huang Ming-Liang ◽  
Ma Hai-Tao ◽  
Liu Xiao-Ping
Keyword(s):  
Growth Kinetics ◽  
Solder Joints ◽  
Kinetics Of

Microstructures evolution and growth kinetics of intermetallic compounds in Cu/Sn/Cu system during ultrasonic soldering process

2021 ◽  
Vol ahead-of-print (ahead-of-print) ◽  
Author(s):  
Xu Han ◽  
Xiaoyan Li ◽  
Peng Yao
Keyword(s):  
Grain Boundary ◽  
Microstructural Evolution ◽  
Growth Kinetics ◽  
Boundary Diffusion ◽  
Solder Joints ◽  
Content Type ◽  
Soldering Process ◽  
Different Temperatures ◽  
Ultrasonic Soldering ◽  
Kinetics Of

Purpose This study aims to investigate the effect of ultrasound on interfacial microstructures and growth kinetics of intermetallic compounds (IMCs) at different temperatures. Design/methodology/approach To investigate the effect of ultrasound on IMCs growth quantitatively, the cross-sectional area of IMCs layers over a confirmed length was obtained for calculating the thickness of the IMCs layer. Findings The generation of dimensional difference in normal direction between Cu6Sn5 and its adjacent Cu6Sn5, formation of bossed Cu6Sn5 and non-interfacial Cu6Sn5 in ultrasonic solder joints made the interfacial Cu6Sn5 layer present a non-scallop-like morphology different from that of traditional solder joints. At 260°C and 290°C, the Cu3Sn layer presented a wave-like shape. In contrast, at 320°C, the Cu3Sn in ultrasonic solder joints consisted of non-interfacial Cu3Sn and interfacial Cu3Sn with a branch-like shape. The Cu6Sn5/Cu3Sn boundary and Cu3Sn/Cu interface presented a sawtooth-like shape under the effect of ultrasound. The predominant mechanism of ultrasonic-assisted growth of Cu6Sn5 growth at 260°C, 290°C and 320°C involved the grain boundary diffusion accompanied by grain coarsening. The Cu3Sn growth was controlled by volume diffusion during the ultrasonic soldering process at 260°C and 290°C. The diffusion mechanism of Cu3Sn growth transformed to grain boundary diffusion accompanied by grain coarsening when the ultrasonic soldering temperature was increased to 320°C. Originality/value The microstructural evolution and growth kinetics of IMCs in ultrasonically prepared ultrasonic solder joints at different temperatures have rarely been reported in previous studies. In this study, the effect of ultrasound on microstructural evolution and growth kinetics of IMCs was systematically investigated.

scholarly journals Effect of Power Cycling and Heat Aging on Reliability and IMC Growth of Sn-5Sb and Sn-10Sb Solder Joints

2018 ◽  
Vol 2018 ◽  
pp. 1-6
Author(s):  
Tatsuya Kobayashi ◽  
Ikuo Shohji ◽  
Yusuke Nakata
Keyword(s):  
Growth Kinetics ◽  
Aging Temperature ◽  
Solder Joints ◽  
High Reliability ◽  
Power Cycles ◽  
Power Cycle ◽  
Cycling Test ◽  
Power Cycling ◽  
Reliability Of Solder Joints ◽  
Kinetics Of

Power cycle reliability of solder joints with Sn-5Sb (mass%) and Sn-10Sb (mass%) alloys was investigated. The effects of power cycling and heat aging on the growth of intermetallic compound (IMC) layers at the interfaces between Sn-Sb alloys and Cu plates were also investigated. In the power cycling test, the solder joint with Sn-10Sb has high reliability compared with that of Sn-5Sb. IMC layers grew in both joints with increasing number of power cycles. Compared with Sn-5Sb and Sn-10Sb, difference in growth kinetics of IMC layers was negligible. A similar tendency was observed in the heat aging test. Compared with the power cycling and the heat aging, growth of IMC layers at the aging temperature of 200°C is faster than that in the power cycling test at the temperature range of 100°C to 200°C, while that at the aging temperature of 100°C, the growth is slower. On the basis of the comparison between the power cycling and the heat aging, it was clarified that growth kinetics of IMC layers in the power cycling can be predicted by investigating growth kinetics of the IMC layer at the temperatures in the vicinity of the peak temperature in power cycling.

scholarly journals Study of growth kinetics of intermetallic phases in Cu-Sn solder joints under the conditions of reactive diffusion

2021 ◽  
Author(s):  
Jaromír DRÁPALA ◽  
Gabriela KOSTIUKOVÁ ◽  
Hana FRANCOVÁ ◽  
Monika LOSERTOVÁ ◽  
Petr KUBÍČEK
Keyword(s):  
Growth Kinetics ◽  
Solder Joints ◽  
Intermetallic Phases ◽  
Reactive Diffusion ◽  
Kinetics Of

Ripening Growth Kinetics of Cu6Sn5 Grains in Sn-3.0Ag-0.5Cu-xTiO2/Cu Solder Joints During the Reflow Process

2018 ◽  
Vol 140 (1) ◽  
Author(s):  
Y. Tang ◽  
S. M. Luo ◽  
G. Y. Li ◽  
Z. Yang ◽  
C. J. Hou
Keyword(s):  
Grain Size ◽  
Interfacial Reaction ◽  
Growth Kinetics ◽  
Solder Joints ◽  
Dominant Role ◽  
Grain Morphology ◽  
Tio2 Nanoparticle ◽  
Reflow Time ◽  
Order Of Magnitude ◽  
Kinetics Of

The ripening growth kinetics of interfacial Cu6Sn5 grains between Cu substrates and Sn-3.0Ag-0.5Cu-xTiO2 (x = 0, 0.02, 0.05, 0.1, 0.3, and 0.6 wt %) (SAC305-xTiO2) solders were investigated. The results show that the Cu6Sn5 grain morphology is affected by the solder composition and the reflow time. The Cu6Sn5 grain size decreases upon addition of TiO2 and shows a significant decrease when the TiO2 nanoparticle fraction is increased to 0.1 wt %. At higher TiO2 nanoparticle fractions, the Cu6Sn5 grain size increases slightly. The growth of the Cu6Sn5 grains is mainly supplied by the flux of the interfacial reaction and the flux of ripening; the ripening flux plays a dominant role because it is approximately one order of magnitude greater than the interfacial reaction flux. The ripening growth of the Cu6Sn5 grains in the TiO2-containing solder joints is reduced more effectively than that of the Cu6Sn5 grains in the TiO2-free joint. For the SAC305/Cu and SAC305-0.6TiO2/Cu solder joints, the particle size distribution (PSD) of the Cu6Sn5 grains is well fit with the Marqusee and Ross (MR) model when the normalized size value of r/<r> is less than 1, and it is consistent with the flux-driven ripening (FDR) model when the value of r/<r> is greater than 1. On the other hand, for the SAC305-0.1TiO2/Cu solder joint, the Cu6Sn5 grains with a nearly hemispheric scallop shape and the PSD of the Cu6Sn5 grains show good agreement with the FDR model.

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