scholarly journals Three-dimensional numerial simulation of single event upset effects in static random access memory

2009 ◽  
Vol 58 (12) ◽  
pp. 8651
Author(s):  
Zhang Ke-Ying ◽  
Guo Hong-Xia ◽  
Luo Yin-Hong ◽  
He Bao-Ping ◽  
Yao Zhi-Bin ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Random Access ◽  
Random Access Memory ◽  
Static Random Access Memory ◽  
Single Event Upset ◽  
Single Event ◽  
Access Memory ◽  
Numerial Simulation

Single-Event Upset Test of Static Random Access Memory Using Single-Ion Microprobe

1992 ◽  
Vol 31 (Part 1, No. 12A) ◽  
pp. 4025-4028 ◽  
Author(s):  
Takashi Matsukawa ◽  
Katsunori Noritake ◽  
Meishoku Koh ◽  
Ken-ichi Hara ◽  
Makoto Goto ◽  
...  
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Static Random Access Memory ◽  
Ion Microprobe ◽  
Single Event Upset ◽  
Single Event ◽  
Access Memory

Evaluation of Fast Neutron Induced Single Event Upset in a Static Random Access Memory and Simulation by Monte Carlo N-Particle Code (MCNPX)

2004 ◽  
Vol 43 (No. 6B) ◽  
pp. L797-L799 ◽  
Author(s):  
Yutaka Arita ◽  
Mikio Takai ◽  
Izumi Ogawa ◽  
Tadafumi Kishimoto ◽  
Yasuki Nagai ◽  
...  
Keyword(s):  
Monte Carlo ◽  
Fast Neutron ◽  
Random Access ◽  
Random Access Memory ◽  
Static Random Access Memory ◽  
Single Event Upset ◽  
Single Event ◽  
Access Memory

Single event upset on static random access memory devices due to spallation, reactor, and monoenergetic neutrons

2019 ◽  
Vol 28 (10) ◽  
pp. 104212
Author(s):  
Xiao-Ming Jin ◽  
Wei Chen ◽  
Jun-Lin Li ◽  
Chao Qi ◽  
Xiao-Qiang Guo ◽  
...  
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Static Random Access Memory ◽  
Memory Devices ◽  
Single Event Upset ◽  
Single Event ◽  
Access Memory
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