Pore structure determination of mesoporous SiO2 thin films by slow positron annihilation spectroscopy
2012 ◽
Vol 524
◽
pp. 22-25
◽
Keyword(s):
2011 ◽
Vol 5
(4)
◽
pp. 636-646
◽
2004 ◽
Vol 42
(13)
◽
pp. 2441-2459
◽
Keyword(s):
2020 ◽
Vol 137
(2)
◽
pp. 205-208
◽
Keyword(s):
1995 ◽
Vol 196-201
◽
pp. 1165-1170
◽
Keyword(s):
1988 ◽
Vol 122
(1)
◽
pp. 143-153
◽
Keyword(s):
2001 ◽
Vol 155
(1-4)
◽
pp. 139-144
◽