scholarly journals Structural and optical properties and charge transfer study for C60-PMMA composite films

2005 ◽  
Vol 54 (6) ◽  
pp. 2859
Author(s):  
Ma Hua-Li ◽  
Li Ying-Lan ◽  
Yang Bao-Hua ◽  
Wang Feng
Optik ◽  
2019 ◽  
Vol 187 ◽  
pp. 111-116
Author(s):  
M.S.E. Hamroun ◽  
K. Bachari ◽  
L. Guerbous ◽  
A. Berrayah ◽  
L. Mechernene

2013 ◽  
Vol 2013 ◽  
pp. 1-10 ◽  
Author(s):  
Mahshad Ghanipour ◽  
Davoud Dorranian

The effect of silver nanoparticles doped in PVA on the structural and optical properties of composite films is studied experimentally. Samples are PVA films of 0.14 mm thickness doped with different sizes and concentrations of silver nanoparticles. Structural properties are studied using X-ray diffraction and FTIR spectrum. Using the reflectance and transmittance of samples, the effect of doped nanoparticles and their concentration on optical parameters of PVA films include absorption coefficient, optical bandgap energy, complex refractive index, complex dielectric function, complex optical conductivity, and relaxation time is extracted and discussed. The dispersion of the refractive index of films in terms of the single oscillator Wemple-DiDomenico (WD) model is investigated and the dispersion parameters are calculated. Results show that by doping silver nanoparticles in PVA, number of Bragg’s planes in the structure of polymer and its crystallinity are increased noticeably. Ag–O bonds are formed in the films and the bandgap energy of samples is decreased. Calculations based on WD model confirm that by doping nanoparticles, the anion strength of PVA as a dielectric medium is decreased.


2018 ◽  
Vol 23 (3) ◽  
pp. 230-239
Author(s):  
E.P. Zaretskaya ◽  
◽  
V.F. Gremenok ◽  
A.V. Stanchik ◽  
A.N. Pyatlitski ◽  
...  

2016 ◽  
Vol 12 (3) ◽  
pp. 4394-4399
Author(s):  
Sura Ali Noaman ◽  
Rashid Owaid Kadhim ◽  
Saleem Azara Hussain

Tin Oxide and Indium doped Tin Oxide (SnO2:In) thin films were deposited on glass and Silicon  substrates  by  thermal evaporation technique.  X-ray diffraction pattern of  pure SnO2 and SnO2:In thin films annealed at 650oC and the results showed  that the structure have tetragonal phase with preferred orientation in (110) plane. AFM studies showed an inhibition of grain growth with increase in indium concentration. SEM studies of pure  SnO2 and  Indium doped tin oxide (SnO2:In) ) thin films showed that the films with regular distribution of particles and they have spherical shape.  Optical properties such as  Transmission , optical band-gap have been measured and calculated.


Sign in / Sign up

Export Citation Format

Share Document