scholarly journals AUGER DEPTH PROFILE ANALYSIS OF GexSi1-x/Si SUPERLATTICE

1991 ◽  
Vol 40 (9) ◽  
pp. 1514
Author(s):  
WEI XING ◽  
JIANG WEI-DONG ◽  
ZHOU GUO-LIANG ◽  
YU MING-REN ◽  
WANC XUN
Keyword(s):  
Depth Profile ◽  
Profile Analysis ◽  
Depth Profile Analysis ◽  
Auger Depth Profile

Auger depth profile analysis and photoluminescence investigations of Zn1−xMgxSe alloys

2002 ◽  
Vol 507-510 ◽  
pp. 175-180 ◽  
Author(s):  
A. Bukaluk ◽  
M. Trzciński ◽  
F. Firszt ◽  
S. Łęgowski ◽  
H. Męczyńska
Keyword(s):  
Depth Profile ◽  
Profile Analysis ◽  
Depth Profile Analysis ◽  
Auger Depth Profile

Auger depth profile analysis and EFTEM analysis of annealed Ti/Al-contacts on Si-doped GaN

2001 ◽  
Vol 179 (1-4) ◽  
pp. 213-221 ◽  
Author(s):  
Markus Pidun ◽  
Peter Karduck ◽  
Joachim Mayer ◽  
Klaus Heime ◽  
Bernd Schineller ◽  
...  
Keyword(s):  
Depth Profile ◽  
Profile Analysis ◽  
Depth Profile Analysis ◽  
Auger Depth Profile ◽  
Si Doped

An Auger depth profile analysis of a sputtered Fe-Ti multilayer structure

1991 ◽  
Vol 47 (2) ◽  
pp. 127-138 ◽  
Author(s):  
J. Eymery ◽  
C. Senillou ◽  
J.C. Joud ◽  
A. Chamberod
Keyword(s):  
Depth Profile ◽  
Multilayer Structure ◽  
Profile Analysis ◽  
Depth Profile Analysis ◽  
Auger Depth Profile
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