scholarly journals TRANSFORMATION CHARACTERISTICS OF SPIN WAVE FUNCTION OF A NUCLEUS UNDER SELECTIVE IRRADIATION

1982 ◽  
Vol 31 (2) ◽  
pp. 199
Author(s):  
ZHU XI-WEN ◽  
YE CHAO-HUI
2015 ◽  
Vol 64 (17) ◽  
pp. 177501
Author(s):  
Zheng Yong-Lin ◽  
Lu Meng-Chun ◽  
Guo Hong-Xia ◽  
Bao Xiu-Li

2013 ◽  
Vol 62 (22) ◽  
pp. 227701
Author(s):  
Zheng Yong-Lin ◽  
Wang Xiao-Xi ◽  
Ge Ze-Ling ◽  
Guo Hong-Li ◽  
Yan Gang-Feng ◽  
...  

2009 ◽  
Vol 24 (13) ◽  
pp. 2401-2413 ◽  
Author(s):  
W. ROBERTS ◽  
MUSLEMA PERVIN

The semileptonic decays of the lowest-lying double-heavy baryons are treated in a quark model. For the Ξbb, hyperfine mixing in the spin wave function leaves the total rate for decay into the lowest lying daughter baryons essentially unchanged, but changes the relative rates into the Ξbc and [Formula: see text]. The same pattern is obtained in the decays of the Ωbb. For the Ξbc, this mixing leads to factor of about 17 suppression in the decay rate to the [Formula: see text] when wave functions truncated to the largest components are used, but the total semileptonic decay rate of the parent baryon remains essentially unchanged. For the Ωbc, the decay to the [Formula: see text] is suppressed by a factor of more than 25 from the unmixed case. When the full wave functions are used, the large suppression of the decays to the [Formula: see text] and [Formula: see text] persists.


1997 ◽  
Vol 97 (3) ◽  
pp. 399-406 ◽  
Author(s):  
F. Franjic ◽  
S. Sorella

Author(s):  
Peter Rez

In high resolution microscopy the image amplitude is given by the convolution of the specimen exit surface wave function and the microscope objective lens transfer function. This is usually done by multiplying the wave function and the transfer function in reciprocal space and integrating over the effective aperture. For very thin specimens the scattering can be represented by a weak phase object and the amplitude observed in the image plane is1where fe (Θ) is the electron scattering factor, r is a postition variable, Θ a scattering angle and x(Θ) the lens transfer function. x(Θ) is given by2where Cs is the objective lens spherical aberration coefficient, the wavelength, and f the defocus.We shall consider one dimensional scattering that might arise from a cross sectional specimen containing disordered planes of a heavy element stacked in a regular sequence among planes of lighter elements. In a direction parallel to the disordered planes there will be a continuous distribution of scattering angle.


Author(s):  
D.E. Jesson ◽  
S. J. Pennycook

It is well known that conventional atomic resolution electron microscopy is a coherent imaging process best interpreted in reciprocal space using contrast transfer function theory. This is because the equivalent real space interpretation involving a convolution between the exit face wave function and the instrumental response is difficult to visualize. Furthermore, the crystal wave function is not simply related to the projected crystal potential, except under a very restrictive set of experimental conditions, making image simulation an essential part of image interpretation. In this paper we present a different conceptual approach to the atomic imaging of crystals based on incoherent imaging theory. Using a real-space analysis of electron scattering to a high-angle annular detector, it is shown how the STEM imaging process can be partitioned into components parallel and perpendicular to the relevant low index zone-axis.It has become customary to describe STEM imaging using the analytical treatment developed by Cowley. However, the convenient assumption of a phase object (which neglects the curvature of the Ewald sphere) fails rapidly for large scattering angles, even in very thin crystals. Thus, to avoid unpredictive numerical solutions, it would seem more appropriate to apply pseudo-kinematic theory to the treatment of the weak high angle signal. Diffraction to medium order zero-layer reflections is most important compared with thermal diffuse scattering in very thin crystals (<5nm). The electron wave function ψ(R,z) at a depth z and transverse coordinate R due to a phase aberrated surface probe function P(R-RO) located at RO is then well described by the channeling approximation;


1988 ◽  
Vol 49 (C8) ◽  
pp. C8-1599-C8-1600
Author(s):  
K. Nakamura ◽  
M. Mino ◽  
H. Yamazaki

Author(s):  
І. І. Гайсак ◽  
В. І. Жаба

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