scholarly journals THE AMBIGUITY IN ASSIGNING PHASE SHIFT OF NUCLEON-DEUTERON SCATTERING

1962 ◽  
Vol 18 (4) ◽  
pp. 184
Author(s):  
SHIH HSUEH-DAN
Keyword(s):  
Phase Shift ◽  
Deuteron Scattering

Phase-shift analysis of elastic nucleon-deuteron scattering

1967 ◽  
Vol 92 (3) ◽  
pp. 561-583 ◽  
Author(s):  
W.T.H. Van Oers ◽  
K.W. Brockman
Keyword(s):  
Phase Shift ◽  
Phase Shift Analysis ◽  
Deuteron Scattering ◽  
Shift Analysis

A Phase Shift Analysis of Neutron-Deuteron Scattering

1952 ◽  
Vol 86 (5) ◽  
pp. 727-730 ◽  
Author(s):  
A. L. Latter ◽  
R. Latter
Keyword(s):  
Phase Shift ◽  
Phase Shift Analysis ◽  
Deuteron Scattering ◽  
Shift Analysis

Object Wave Determination by Single-Sideband Methods

1973 ◽  
Vol 31 ◽  
pp. 266-267
Author(s):  
Kenneth H. Downing ◽  
Benjamin M. Siegel
Keyword(s):  
Phase Shift ◽  
Carbon Films ◽  
Object Wave ◽  
Electron Wave ◽  
Phase Object ◽  
Heavy Atoms ◽  
Single Sideband ◽  
Thin Carbon ◽  
Additional Phase Shift ◽  
Additional Phase

Under the “weak phase object” approximation, the component of the electron wave scattered by an object is phase shifted by π/2 with respect to the unscattered component. This phase shift has been confirmed for thin carbon films by many experiments dealing with image contrast and the contrast transfer theory. There is also an additional phase shift which is a function of the atomic number of the scattering atom. This shift is negligible for light atoms such as carbon, but becomes significant for heavy atoms as used for stains for biological specimens. The light elements are imaged as phase objects, while those atoms scattering with a larger phase shift may be imaged as amplitude objects. There is a great deal of interest in determining the complete object wave, i.e., both the phase and amplitude components of the electron wave leaving the object.

A Many-Beam Technique for Enhanced Resolution of Partial Dislocations

1972 ◽  
Vol 30 ◽  
pp. 646-647
Author(s):  
J. M. Oblak ◽  
B. H. Kear
Keyword(s):  
Phase Shift ◽  
Field Method ◽  
Dark Field ◽  
Bright Field ◽  
Field Technique ◽  
Weak Beam ◽  
Partial Dislocations ◽  
Enhanced Resolution ◽  
Nickel Base ◽  
Beam Technique

The “weak-beam” and systematic many-beam techniques are the currently available methods for resolution of closely spaced dislocations or other inhomogeneities imaged through strain contrast. The former is a dark field technique and image intensities are usually very weak. The latter is a bright field technique, but generally use of a high voltage instrument is required. In what follows a bright field method for obtaining enhanced resolution of partial dislocations at 100 KV accelerating potential will be described.A brief discussion of an application will first be given. A study of intermediate temperature creep processes in commercial nickel-base alloys strengthened by the Ll2 Ni3 Al γ precipitate has suggested that partial dislocations such as those labelled 1 and 2 in Fig. 1(a) are in reality composed of two closely spaced a/6 <112> Shockley partials. Stacking fault contrast, when present, tends to obscure resolution of the partials; thus, conditions for resolution must be chosen such that the phase shift at the fault is 0 or a multiple of 2π.

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