scholarly journals Special issue : Fourth environmental system automatic measurement/control domestic workshop.Measurement of sludge density by microwaves.

1992 ◽  
Vol 21 (12) ◽  
pp. 739-742
Author(s):  
Takatsugu OGATA ◽  
Ikuo ARAI ◽  
Seiji YAMAGUCHI
Keyword(s):  
Automatic Measurement ◽  
Special Issue ◽  
Environmental System ◽  
Measurement Control

Meteorological Instruments Visualized Verification Integrated System

2013 ◽  
Vol 475-476 ◽  
pp. 803-806
Author(s):  
Xin Di Li
Keyword(s):  
Data Acquisition ◽  
Real Time ◽  
Automatic Measurement ◽  
Integrated System ◽  
Image Simulation ◽  
Work Efficiency ◽  
Certification Process ◽  
Measurement Control ◽  
Measurement Verification ◽  
Meteorological Instruments

This Meteorological Instruments Visualized Verification Integrated System (MIVVIS) bases on existing conventional metrology business, using measurement verification image simulation technology, dynamic displays changes of the certification process and data acquisition in real-time, completes remote automatic measurement, control and regulation, improves work efficiency, and provides technical support to the new equipments of atmospheric monitoring automation projects.

Automatic measurement of SAED patterns from asbestos minerals

1988 ◽  
Vol 46 ◽  
pp. 846-847
Author(s):  
J. C. Russ ◽  
T. Taguchi ◽  
P. M. Peters ◽  
E. Chatfield ◽  
J. C. Russ ◽  
...  
Keyword(s):  
Diffraction Pattern ◽  
High Precision ◽  
Diffraction Data ◽  
Automatic Measurement ◽  
Automatic Method ◽  
Important Method ◽  
X Ray ◽  
Integrated Intensity ◽  
Asbestiform Minerals ◽  
True Center

Conventional SAD patterns as obtained in the TEM present difficulties for identification of materials such as asbestiform minerals, although diffraction data is considered to be an important method for making this purpose. The preferred orientation of the fibers and the spotty patterns that are obtained do not readily lend themselves to measurement of the integrated intensity values for each d-spacing, and even the d-spacings may be hard to determine precisely because the true center location for the broken rings requires estimation. We have implemented an automatic method for diffraction pattern measurement to overcome these problems. It automatically locates the center of patterns with high precision, measures the radius of each ring of spots in the pattern, and integrates the density of spots in that ring. The resulting spectrum of intensity vs. radius is then used just as a conventional X-ray diffractometer scan would be, to locate peaks and produce a list of d,I values suitable for search/match comparison to known or expected phases.

Sign in / Sign up

Export Citation Format

Share Document