scholarly journals The excess attenuation of electric field in the presence of deciduous trees

2017 ◽  
Vol 9 (1) ◽  
pp. 55-60
Author(s):  
Jovana Perovic ◽  
Dragan Olcan
Holzforschung ◽  
2020 ◽  
Vol 74 (12) ◽  
pp. 1113-1122
Author(s):  
Sergey Khviyuzov ◽  
Konstantin Bogolitsyn ◽  
Aleksandr Volkov ◽  
Gennadiy Koposov ◽  
Maria Gusakova

AbstractLignins are among the most common plant polymers and demonstrate pronounced electrical conductivity properties due to their conjugated polymolecular aromatic structure and polyfunctional nature. Electrical conductivity and dielectric properties of lignins from conifers and deciduous trees in the range of electric field frequencies from 10−2 to 107 Hz were investigated by means of dielectric spectroscopy. Characteristic parameters of static and high frequency electrical conductivity were calculated. To study the influence of the lignins functional nature on their electrophysical properties, the study determined three types of relaxators (separate charges or charge systems in the structure of a substance changing their position in space when exposed to an external alternating electric field) in the structure of the lignin macromolecule. Low-frequency relaxators are associated with oscillations of methoxyl groups. Mid-frequency relaxators correspond predominantly to phenolic hydroxyl groups and to hydroxyl groups of adsorbed water. High-frequency relaxators correspond to the hopping of π-electrons along the chain of conjugated bonds of a benzene ring. Differences in the structure and functional nature of lignins from conifers and deciduous trees cause different contributions of low-frequency relaxators. As a result, these features form differences in the electrophysical properties of lignins from conifers and deciduous trees.


Author(s):  
G. F. Rempfer

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.


Author(s):  
Patrick P. Camus

The theory of field ion emission is the study of electron tunneling probability enhanced by the application of a high electric field. At subnanometer distances and kilovolt potentials, the probability of tunneling of electrons increases markedly. Field ionization of gas atoms produce atomic resolution images of the surface of the specimen, while field evaporation of surface atoms sections the specimen. Details of emission theory may be found in monographs.Field ionization (FI) is the phenomena whereby an electric field assists in the ionization of gas atoms via tunneling. The tunneling probability is a maximum at a critical distance above the surface,xc, Fig. 1. Energy is required to ionize the gas atom at xc, I, but at a value reduced by the appliedelectric field, xcFe, while energy is recovered by placing the electron in the specimen, φ. The highest ionization probability occurs for those regions on the specimen that have the highest local electric field. Those atoms which protrude from the average surfacehave the smallest radius of curvature, the highest field and therefore produce the highest ionizationprobability and brightest spots on the imaging screen, Fig. 2. This technique is called field ion microscopy (FIM).


1993 ◽  
Vol 3 (8) ◽  
pp. 1201-1225 ◽  
Author(s):  
G. N�ron de Surgy ◽  
J.-P. Chabrerie ◽  
O. Denoux ◽  
J.-E. Wesfreid

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