scholarly journals Systematization and generalization of local exhaust devices characteristics - the basis for engineering design techniques of effective industrial ventilation

2012 ◽  
Vol 32 (6) ◽  
pp. 54-59 ◽  
Author(s):  
A.G. Sotnikov ◽  
A.A. Borovitskiy
Keyword(s):  
Engineering Design ◽  
Industrial Ventilation ◽  
Design Techniques

The Tribology of Automotive Components: Development of Verified Predictive Design Techniques

1990 ◽  
Vol 204 (1) ◽  
pp. 1-19 ◽  
Author(s):  
D A Parker
Keyword(s):  
Engineering Design ◽  
Design Strategy ◽  
Automotive Components ◽  
Iterative Development ◽  
Product Engineering ◽  
Wide Range ◽  
Predictive Design ◽  
Design Techniques

The paper describes the iterative development of verified predictive techniques, with examples taken from a wide range of lubricated and non-lubricated automotive components. The techniques can be used to propose a model which can be applied in real design situations where integration into an overall product engineering design strategy is required.

A review categorizing engineering design techniques of plant environmental simulators

1973 ◽  
Vol 18 (1) ◽  
pp. 13-29 ◽  
Author(s):  
D.G. Barbee ◽  
S.P. Goplen ◽  
O.B. Thomas ◽  
C.E. Nuckolls
Keyword(s):  
Engineering Design ◽  
Design Techniques

Resolution and measurement in the scanning electron microscope

1987 ◽  
Vol 45 ◽  
pp. 534-537 ◽  
Author(s):  
Michael T. Postek
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Engineering Design ◽  
Resolving Power ◽  
Practical Applications ◽  
Instrument Resolution ◽  
Accurate Definition ◽  
Definition Of ◽  
Scanning Electron ◽  
Better Than

The term ultimate resolution or resolving power is the very best performance that can be obtained from a scanning electron microscope (SEM) given the optimum instrumental conditions and sample. However, as it relates to SEM users, the conventional definitions of this figure are ambiguous. The numbers quoted for the resolution of an instrument are not only theoretically derived, but are also verified through the direct measurement of images on micrographs. However, the samples commonly used for this purpose are specifically optimized for the measurement of instrument resolution and are most often not typical of the sample used in practical applications.SEM RESOLUTION. Some instruments resolve better than others either due to engineering design or other reasons. There is no definitively accurate definition of how to quantify instrument resolution and its measurement in the SEM.

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