scholarly journals Effect of Transition Metal on Structural and Dielectric Properties of Mg0.5Tm0.5Fe2O4 (Tm = Zn and Cu) System

2021 ◽  
Author(s):  
Pallavi Saxena ◽  
Anand Yadav
Keyword(s):  
Dielectric Constant ◽  
Dielectric Properties ◽  
Interfacial Polarization ◽  
Xrd Analysis ◽  
X Ray Diffraction ◽  
High Frequencies ◽  
X Ray ◽  
Cubic Structure ◽  
High Dielectric

This study explored the structural and dielectric features of Mg0.5Tm0.5Fe2O4 (Tm = Zn and Cu) that were synthesized by the Solid-state reaction (SSR) method. The X-ray powder diffraction (XRD) analysis reveals that the prepared samples are single-phase cubic structure without any impurity. Rietveld-refined X-ray diffraction results reveal the formation of cubic structure and all the peaks of Mg0.5Zn0.5Fe2O4 and Mg0.5Cu0.5Fe2O4 are perfectly indexed in the cubic (Fd-3 m) structure. Dielectric constant and dielectric loss variation with frequency were also explored. Both decrease when the relevant alternating field is increasing and become constant at high frequencies which reflects the important role of interfacial polarization. Furthermore, the Mg0.5Cu0.5Fe2O4 having the smallest crystallite size (~ 44.73 nm) has a high dielectric constant (~ 4.41 × 104) value as compare to Mg0.5Zn0.5Fe2O4.

scholarly journals Effect of Zinc Doping on the Electrical and Dielectric Properties of CCTO Compound Synthesized by Solid-State Method

2021 ◽  
Vol 33 (9) ◽  
pp. 2000-2006
Author(s):  
M. Slaoui ◽  
N. Gouitaa ◽  
Y. El Issmaeli ◽  
A. Harrach ◽  
F. Abdi ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Dielectric Properties ◽  
Solid State ◽  
Xrd Analysis ◽  
X Ray Diffraction ◽  
Solid State Method ◽  
X Ray ◽  
Zn Concentration ◽  
Zinc Doping ◽  
Electrical And Dielectric Properties

In this work, the influence of zinc doping on structural and dielectric properties of CaCu(3-x)ZnxTi4O12 (CCZxTO with x = 0, 2.5, 5, 7.5, 10, 12.5 and 15%) ceramics sintered at 1000 ºC for 8 h was studied. The ceramic samples were prepared by the conventional solid-state and calcined at 1050 ºC for 4 h. The X-ray diffraction (XRD) analysis of pure and Zn-doped CCTO were analyzed by using Rietveld refinement with cubic CCTO phase with no trace impurity phase. The scanning electron microscopy (SEM) investigation showed that for Zn-doped CCTO, the grains distributions were homogenous with average sizes which decreased with increasing of Zn concentration. The dielectric permittivity as function of temperature showed two dielectric anomalies (weakly and strong) and the dielectric constant value largely decreased for x = 2.5%, which is about tree magnitude smaller than the pure ceramic. Then it increased and reached a maximum at x = 10%, which is larger than the value of pure ceramic. And for x > 10%, the dielectric constant decreased for about two magnitude smaller than the ceramic at x = 10%. The cole-cole diagramm for all the samples showed existence of two semi-arcs attributed to the grains and grains boundaries. It was found that the Rg values were much smaller than the Rgb value. This give an evidance on the formation of interior barrier layer capacity (IBLC).

scholarly journals A Composite of (95%) La2CoMnO6+ (5%) Ba0.5Na0.5TiO3 : Study of Structural and Dielectric Properties

2021 ◽  
Vol 2070 (1) ◽  
pp. 012093
Author(s):  
Dharmendra Mewada ◽  
Rajesh Kumar Katare
Keyword(s):  
Dielectric Constant ◽  
Dielectric Properties ◽  
Room Temperature ◽  
High Dielectric Constant ◽  
Project Work ◽  
X Ray Diffraction ◽  
X Ray ◽  
Frequency Independent ◽  
Diffraction Peaks ◽  
High Dielectric

Abstract This project work reports synthesis, structural and dielectric nature of composite of the type (95%) La2CoMnO6+ (5%) Ba0.5Na0.5TiO3. The composite was characterized at room temperature for structural and dielectric properties. The structural characterization X-ray diffraction was carried for structural confirmation. The XRD data study convey the sample is dual phase in nature evident from the corresponding diffraction peaks. Monoclinic phase was acquired by La2CoMnO6 and the space groupof the phase is P 1 21/n whereas Ba0.5Na0.5TiO3 phase has acquired cubic structure with space group Pm-3m. The frequency dependent dielectric constant examined reveals high dielectric constant which decreases with increase in applied ac field values. Dielectric loss calculated shows the behaviour like dielectric constant which initially decreases abruptly with applied field and later attains frequency independent values. However, the ac conductivity was observed higher in the as synthesized.

Effect of Ni Nano-Powders Addition on the Dielectric Properties of Ba(Ti,Zr)O3 Based Y5V Ceramics

2007 ◽  
Vol 124-126 ◽  
pp. 691-694
Author(s):  
Lei Chen ◽  
Xiao Hui Wang ◽  
Long Tu Li ◽  
Zhi Lun Gui
Keyword(s):  
Dielectric Constant ◽  
Dielectric Properties ◽  
Ceramic Matrix ◽  
Xrd Analysis ◽  
Primary Phase ◽  
Polarization Degree ◽  
X Ray Diffraction ◽  
X Ray ◽  
Perovskite Lattice ◽  
Scanning Electron

In this paper, the influence of nickel (Ni) nano-powders addition on the microstructures and dielectric properties of Ba(Ti,Zr)O3 based Y5V non-reducing ceramics were investigated. The X-ray diffraction (XRD) analysis indicated that the primary phase was Ba(Ti,Zr)O3 and no Ni phase appeared until the amount of Ni exceeded 5mol%. Scanning electron microscope (SEM) observation showed that the Ni particles distributed homogenously throughout BTZ ceramic matrix. The incorporation of Ni altered the perovskite lattice parameters and thus led to the change of polarization degree under electric field and the improvement of the dielectric constant at Curie temperature.

INVESTIGATIONS ON Sm- AND Nb-SUBSTITUTED PZT CERAMICS

2006 ◽  
Vol 20 (29) ◽  
pp. 1879-1882 ◽  
Author(s):  
CHANDRA PRAKASH ◽  
J. K. JUNEJA
Keyword(s):  
Dielectric Constant ◽  
Single Phase ◽  
Xrd Analysis ◽  
Chemical Formula ◽  
X Ray Diffraction ◽  
Pzt Ceramics ◽  
Ceramic Method ◽  
X Ray ◽  
Niobium Doping ◽  
Constant Versus

In the present paper, we report the effect of Samarium substitution and Niobium doping on the properties of a PZT(52:48). The properties studied are: structural, dielectric and ferroelectric. The samples with chemical formula Pb 0.99 Sm 0.01 Zr 0.52 Ti 0.48 O 3 were prepared by solid-state dry ceramic method. Small amount (0.5 wt%) of Nb 2 O 5 was also added. X-ray diffraction (XRD) analysis showed formation of a single phase with tetragonal structure. Dielectric properties were studied as a function of temperature and frequency. Transition temperature, Tc, was determined from dielectric constant versus temperature plot. The material shows well-defined ferroelectric (PE) hysteresis loop.

Phase Development and Dielectric Properties of 0.98BaTiO3-0.02Ba (Mg1/3Nb2/3) O3 Ceramic

2011 ◽  
Vol 700 ◽  
pp. 58-62
Author(s):  
Rachanusorn Roongtao ◽  
Supagorn Rugmai ◽  
Wanwilai C. Vittayakorn
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Dielectric Constant ◽  
Dielectric Properties ◽  
Loss Factor ◽  
X Ray Diffraction ◽  
Phase Purity ◽  
X Ray ◽  
Phase Development ◽  
Scanning Electron

The 0.98BaTiO3-0.02Ba (Mg1/3Nb2/3) O3ceramics has been synthesized through a conventional mixed-oxide by using BT nanopowder and BMN micropowder. The phase purity of the powders and the ceramics was examined using X-ray diffraction (XRD). The 0.98BT-0.02BMN powders were sintered to 92% of the theoretical density at a temperature of 1300 °C for 2 h. The microstructure of the sintered surface was investigated using scanning electron microscopy (SEM). The dielectric constant (εr) and loss factor (tanδ) of the sintered pellets at Curie temperture were 3000 and 0.015, respectively.

Dielectric Properties and Raman Spectroscopy in Ca-Substituted Na0.5Bi0.5TiO3 Ferroelectric Ceramics

2011 ◽  
Vol 324 ◽  
pp. 298-301 ◽  
Author(s):  
Roy Jean Roukos ◽  
Olivier Bidault ◽  
Julien Pansiot ◽  
Ludivine Minier ◽  
Lucien Saviot
Keyword(s):  
Raman Spectroscopy ◽  
Dielectric Properties ◽  
Room Temperature ◽  
Rhombohedral Phase ◽  
Xrd Analysis ◽  
Solid State Reaction Method ◽  
Ferroelectric Ceramics ◽  
Dielectric Measurements ◽  
X Ray Diffraction ◽  
X Ray

Lead free Na0.5Bi0.5TiO3 (NBT) and (Na0.5Bi0.5TiO3)1-x(CaTiO3)x (NBT-CT) piezoelectric ceramics with the perovskite structure were studied. The NBT and NBT-CT samples were synthesized using a solid-state reaction method and characterized with X-ray diffraction (XRD), Raman spectroscopy and dielectric measurements for several compositions (x = 0, 0.07, 0.15) at room temperature. The XRD analysis showed a stabilization of a rhombohedral phase at a low concentration of Ca (0 < x <0.15), whereas Raman spectra reveal a strong modification for the sample with x = 0.15. The dielectric properties of these ceramics were studied by measuring impedance in the 79-451K temperature range for unpoled and field cooling with an electric field (FC) conditions.

Preparation and Properties of CCTO-BCTO Ceramics with Ultrahigh Dielectric Constant

2013 ◽  
Vol 760-762 ◽  
pp. 705-708
Author(s):  
La Chen ◽  
Wei Li ◽  
Zhao Xian Xiong ◽  
Chun Xiao Song ◽  
Hong Qiu
Keyword(s):  
Electron Microscopy ◽  
Dielectric Constant ◽  
Dielectric Properties ◽  
X Ray Diffraction ◽  
Optimum Amount ◽  
Conventional Solid State Reaction ◽  
X Ray ◽  
Impedance Characteristics ◽  
Lcr Meter ◽  
Scanning Electron

Ceramics of (1-x)CaCu3Ti4O12-xBi2/3Cu3Ti4O12, i.e., CCTO-BCTO, with x=0, 0.01, 0.1 and 0.25, respectively, were prepared via the conventional solid-state reaction. The phase structure of the ceramics was identified by X-ray diffraction. The microstructure of the sample was observed with scanning electron microscopy. Dielectric properties and impedance spectroscopy were measured using a LCR Meter, in which 0.9CCTO-0.1BCTO displayed highest dielectric constant (584108) and lowest dielectric loss (0.42) at 1kHz among the four kinds of specimens. Based on series of experimental results, an optimum amount of x was able to improve the dielectric properties of CCTO-BCTO, through adjusting the impedance characteristics of the grain and grain boundary.

Preparation and Characterization of Ce-Doped Ba0.2Sr0.8TiO3 Ferroelectric Ceramics

2010 ◽  
Vol 97-101 ◽  
pp. 1091-1096
Author(s):  
Dong Fang Han ◽  
Qun Tang ◽  
Qing Meng Zhang ◽  
Lei Wang ◽  
Ju Du
Keyword(s):  
Dielectric Constant ◽  
Xrd Analysis ◽  
Ferroelectric Ceramics ◽  
X Ray Diffraction ◽  
X Ray ◽  
Structure And Property ◽  
Dielectric Constant And Loss ◽  
Ce Content ◽  
Doping Ratio

The structure and property of Ce-doped Ba0.2Sr0.8TiO3 (BST) were investigated as a function of Ce content. The density experiment results confirmed that increasing the Ce doping ratio caused the decrease in shrinkage factor of BST in the sintering procedure. Additionally, both Scanning Electron Microscope (SEM) and X-ray diffraction (XRD) analysis showed that the grain size of Ce-doped BST was dependent on the Ce content. Further more, the dielectric constant and dielectric loss had a curve relationship with increasing Ce content. The improvement of the electrical properties of Ce doping BST may be related to the decrease in the concentration of oxygen vacancies. According to the research, the diameter of grain, the dielectric constant and loss factor of the 1mol% Ce-doped Ba0.2Sr0.8TiO3 were 500nm, 365.8 and 0.0063, respectively.

Effect of Platinum Substitution on the Microstructures and Dielectric Relaxation of CaCu3Ti4O12 Ceramics

2013 ◽  
Vol 802 ◽  
pp. 134-138 ◽  
Author(s):  
Worawut Makcharoen
Keyword(s):  
Dielectric Constant ◽  
Dielectric Properties ◽  
Loss Tangent ◽  
Room Temperature ◽  
High Dielectric Constant ◽  
Ferroelectric Materials ◽  
X Ray Diffraction ◽  
High Loss ◽  
Internal Barrier Layer Capacitor ◽  
High Dielectric

The CaCu3Ti4O12(CCTO) has the advantage for the various applications especially for capacitive elements in microelectronic devices over the ferroelectric materials including BaTiO3. CCTO is a ceramic compound with a high dielectric constant but it has a high loss tangent at room temperature. In this work, the Influences of PtO2doping on the dielectric properties of CaCu3Ti4O12(CCTO) ceramics were investigate. The ceramics CCTO and PtO2doping CCTO were studied by X- ray diffraction, scanning electron microscopy. The dielectric properties have been measured as a function of temperature and frequency range 0.1 - 500 kHz. The XRD shows the CCTO structure does not changes after doping with platinum. The results show that PtO2doped can reduce the mean grain sizes of CCTO, but the dielectric constant still remained a height. The samples of 2.0 mol% Pt-doped have exhibited high dielectric constant of about 22,000 and the loss tangent about 0.7 at room temperature and frequency at 10 kHz. The reduced of the loss tangent could be interpreted with the internal barrier layer capacitor model (IBLC)

Influence of Ti additions on the Texture and Dielectric Properties of LSBN-BST Complex Ceramics

1998 ◽  
Vol 541 ◽  
Author(s):  
J. Portelles ◽  
H. Amorín ◽  
J. M. Siqueiros ◽  
F.F. Castilión ◽  
E. Martínez ◽  
...  
Keyword(s):  
Dielectric Properties ◽  
Oxygen Vacancies ◽  
Tungsten Bronze ◽  
Material Structure ◽  
X Ray Diffraction ◽  
Strontium Barium ◽  
Tetragonal Tungsten Bronze ◽  
X Ray ◽  
First Results

AbstractThe stoichiometric La-Ti doped strontium-barium niobate ceramic system was obtained for different concentrations of Titanium ions (Ti=1,3,5,10,30,50 %), where the Nb5− was substituted by Ti4+ according to the following expression Sr0.255 La0.03Bao0.7Nb2−yTiyO6−y/2 (LSBN-BST). The oxygen vacancies thus created which, together with the vacancies in the A sites of the tetragonal tungsten-bronze (TTB) material structure, have an important influence on their texture and dielectric properties, due to the crucial role of the occupancy of the crystallographic sites. X-ray diffraction, scanning electron microscopy, energy dispersive spectroscopy and thermoelectric analyses are reported. We report the first results for thin films of LSBNT- 7 % obtained by the PLD technique. The diffraction pattern reveals the presence of the LSBNT structure without annealing.

Sign in / Sign up

Export Citation Format

Share Document