Surface Chemical Analysis of Solid-Electrolyte Interphase Layer on Germanium Thin Films and the Effect of Vinylene Carbonate Electrolyte Additive

Lithium-ion Batteries - Thin Film for Energy Materials and Devices ◽

10.5772/intechopen.90032 ◽

2020 ◽

Author(s):

Silpasree S. Jayasree ◽

Shantikumar Nair ◽

Dhamodaran Santhanagopalan

Keyword(s):

Thin Films ◽

Chemical Analysis ◽

Solid Electrolyte ◽

Solid Electrolyte Interphase ◽

Interphase Layer ◽

Surface Chemical ◽

Electrolyte Additive ◽

Vinylene Carbonate ◽

Surface Chemical Analysis

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Surface chemical analysis of cesium-iodide (CsI) coated carbon (C) fibers and thin films for field emission applications

2009 IEEE International Vacuum Electronics Conference ◽

10.1109/ivelec.2009.5193417 ◽

2009 ◽

Cited By ~ 1

Author(s):

Vasilios Vlahos ◽

Dane Morgan ◽

John H. Booske ◽

Don Shiffler

Keyword(s):

Thin Films ◽

Chemical Analysis ◽

Field Emission ◽

Cesium Iodide ◽

Surface Chemical ◽

C Fibers ◽

Coated Carbon ◽

Surface Chemical Analysis

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Photoconductivity and surface chemical analysis of ZnO thin films deposited by solution-processing techniques for nano and microstructure fabrication

Journal of Semiconductors ◽

10.1088/1674-4926/34/3/033001 ◽

2013 ◽

Vol 34 (3) ◽

pp. 033001 ◽

Cited By ~ 9

Author(s):

V. K. Dwivedi ◽

P. Srivastava ◽

G. Vijaya Prakash

Keyword(s):

Thin Films ◽

Chemical Analysis ◽

Zno Thin Films ◽

Solution Processing ◽

Surface Chemical ◽

Microstructure Fabrication ◽

Processing Techniques ◽

Surface Chemical Analysis

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Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials

10.3403/02007712 ◽

2000 ◽

Keyword(s):

Mass Spectrometry ◽

Chemical Analysis ◽

Secondary Ion Mass Spectrometry ◽

Surface Chemical ◽

Atomic Concentration ◽

Ion Mass Spectrometry ◽

Doped Materials ◽

Secondary Ion ◽

Surface Chemical Analysis

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Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use

10.3403/02144326u ◽

2015 ◽

Keyword(s):

Glow Discharge ◽

Chemical Analysis ◽

Optical Emission ◽

Optical Emission Spectrometry ◽

Emission Spectrometry ◽

Surface Chemical ◽

Surface Chemical Analysis

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Surface chemical analysis. Vocabulary

10.3403/02332664 ◽

2001 ◽

Keyword(s):

Chemical Analysis ◽

Surface Chemical ◽

Surface Chemical Analysis

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Surface chemical analysis. High-resolution Auger electron spectrometers. Calibration of energy scales for elemental and chemical-state analysis

10.3403/02704860 ◽

2002 ◽

Keyword(s):

High Resolution ◽

Chemical Analysis ◽

Auger Electron ◽

Chemical State ◽

Surface Chemical ◽

Surface Chemical Analysis ◽

State Analysis

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Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters

10.3403/03239721 ◽

2005 ◽

Keyword(s):

Chemical Analysis ◽

Photoelectron Spectroscopy ◽

Surface Chemical ◽

Performance Parameters ◽

Instrumental Performance ◽

X Ray ◽

Surface Chemical Analysis

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Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction

10.3403/03239706u ◽

2015 ◽

Keyword(s):

Chemical Analysis ◽

Photoelectron Spectroscopy ◽

Surface Chemical ◽

X Ray ◽

Charge Control ◽

Surface Chemical Analysis

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Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale

10.3403/03239681u ◽

2015 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron ◽

Surface Chemical ◽

Intensity Scale ◽

X Ray ◽

Surface Chemical Analysis

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Surface chemical analysis. Auger electron spectroscopy. Repeatability and constancy of intensity scale

10.3403/03267940 ◽

2005 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

Intensity Scale ◽

Surface Chemical Analysis

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